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用于室温近红外传感的晶圆级硫化铅单晶薄膜的外延生长(英文)
Epitaxial growth of wafer-scale PbS single-crystal films for room-temperature near-infrared sensing
【摘要】 The rapid advancement of the Internet of Things has underscored the importance of advanced photodetection technologies, particularly for near-infrared(NIR) sensing and imaging. However, conventional materials such as In Ga As, and Hg Cd Te face significant challenges, such as complex fabrication with high costs and limited room-temperature NIR sensitivity. Here, we report the chemical vapor deposition(CVD)-driven epitaxial growth of wafer scale lead sulfide(Pb S) single-crystal films on Sr Ti O3(STO) substrates. The single-crystal films exhibit exceptional crystallinity with highly oriented domains alignment.By constructing an asymmetric Au-Cr/Pb S/In Zn O(IZO) structures, the devices were enabled with efficient photoresponse. The Schottky contact not only induces a substantial photovoltage under infrared light,breaking through the cryogenic operation limitation of traditional Pb-based devices, but also leads to sub-millisecond response(τrise/τfall= 0.57/0.68 ms). Through the synergistic integration of the highquality single-crystalline film with the asymmetric interfacial engineering, we achieve roomtemperature, zero-bias infrared imaging. As a result, the devices exhibit a specific detectivity D* of 9.8 × 1010cm Hz1/2W-1, offering a scalable pathway toward low-cost, uncooled infrared imaging systems and demonstrating significant potential for practical applications.
【Abstract】 The rapid advancement of the Internet of Things has underscored the importance of advanced photodetection technologies, particularly for near-infrared(NIR) sensing and imaging. However, conventional materials such as In Ga As, and Hg Cd Te face significant challenges, such as complex fabrication with high costs and limited room-temperature NIR sensitivity. Here, we report the chemical vapor deposition(CVD)-driven epitaxial growth of wafer scale lead sulfide(Pb S) single-crystal films on Sr Ti O3(STO) substrates. The single-crystal films exhibit exceptional crystallinity with highly oriented domains alignment.By constructing an asymmetric Au-Cr/Pb S/In Zn O(IZO) structures, the devices were enabled with efficient photoresponse. The Schottky contact not only induces a substantial photovoltage under infrared light,breaking through the cryogenic operation limitation of traditional Pb-based devices, but also leads to sub-millisecond response(τrise/τfall= 0.57/0.68 ms). Through the synergistic integration of the highquality single-crystalline film with the asymmetric interfacial engineering, we achieve roomtemperature, zero-bias infrared imaging. As a result, the devices exhibit a specific detectivity D* of 9.8 × 1010cm Hz1/2W-1, offering a scalable pathway toward low-cost, uncooled infrared imaging systems and demonstrating significant potential for practical applications.
【Key words】 Lead sulfide; Chemical vapor deposition; Asymmetric electrodes; Room-temperature near-infrared imaging; Schottky barrier;
- 【文献出处】 Science Bulletin ,科学通报(英文版) , 编辑部邮箱 ,2026年07期
- 【分类号】TP212;TB383.2
- 【下载频次】3