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用于室温近红外传感的晶圆级硫化铅单晶薄膜的外延生长(英文)

Epitaxial growth of wafer-scale PbS single-crystal films for room-temperature near-infrared sensing

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【作者】 朱昊文耀程瑞清尹蕾刘雍江潮王皓熊自仁蔡传洋涂阳远王启胜方龙何军

【Author】 Hao Zhu;Yao Wen;Ruiqing Cheng;Lei Yin;Yong Liu;Chao Jiang;Hao Wang;Ziren Xiong;Chuanyang Cai;Yangyuan Tu;Qisheng Wang;Long Fang;Jun He;Key Laboratory of Artificial Micro- and Nano-structures of Ministry of Education and School of Physics and Technology, Wuhan University;School of Physics and Materials Science, Nanchang University;Renewable Energy School, Inner Mongolia University of Technology;Wuhan Institute of Quantum Technology;Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences;

【通讯作者】 文耀;方龙;何军;

【机构】 Key Laboratory of Artificial Micro- and Nano-structures of Ministry of Education and School of Physics and Technology, Wuhan UniversitySchool of Physics and Materials Science, Nanchang UniversityRenewable Energy School, Inner Mongolia University of TechnologyWuhan Institute of Quantum TechnologyCenter of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences

【摘要】 The rapid advancement of the Internet of Things has underscored the importance of advanced photodetection technologies, particularly for near-infrared(NIR) sensing and imaging. However, conventional materials such as In Ga As, and Hg Cd Te face significant challenges, such as complex fabrication with high costs and limited room-temperature NIR sensitivity. Here, we report the chemical vapor deposition(CVD)-driven epitaxial growth of wafer scale lead sulfide(Pb S) single-crystal films on Sr Ti O3(STO) substrates. The single-crystal films exhibit exceptional crystallinity with highly oriented domains alignment.By constructing an asymmetric Au-Cr/Pb S/In Zn O(IZO) structures, the devices were enabled with efficient photoresponse. The Schottky contact not only induces a substantial photovoltage under infrared light,breaking through the cryogenic operation limitation of traditional Pb-based devices, but also leads to sub-millisecond response(τrisefall= 0.57/0.68 ms). Through the synergistic integration of the highquality single-crystalline film with the asymmetric interfacial engineering, we achieve roomtemperature, zero-bias infrared imaging. As a result, the devices exhibit a specific detectivity D* of 9.8 × 1010cm Hz1/2W-1, offering a scalable pathway toward low-cost, uncooled infrared imaging systems and demonstrating significant potential for practical applications.

【Abstract】 The rapid advancement of the Internet of Things has underscored the importance of advanced photodetection technologies, particularly for near-infrared(NIR) sensing and imaging. However, conventional materials such as In Ga As, and Hg Cd Te face significant challenges, such as complex fabrication with high costs and limited room-temperature NIR sensitivity. Here, we report the chemical vapor deposition(CVD)-driven epitaxial growth of wafer scale lead sulfide(Pb S) single-crystal films on Sr Ti O3(STO) substrates. The single-crystal films exhibit exceptional crystallinity with highly oriented domains alignment.By constructing an asymmetric Au-Cr/Pb S/In Zn O(IZO) structures, the devices were enabled with efficient photoresponse. The Schottky contact not only induces a substantial photovoltage under infrared light,breaking through the cryogenic operation limitation of traditional Pb-based devices, but also leads to sub-millisecond response(τrisefall= 0.57/0.68 ms). Through the synergistic integration of the highquality single-crystalline film with the asymmetric interfacial engineering, we achieve roomtemperature, zero-bias infrared imaging. As a result, the devices exhibit a specific detectivity D* of 9.8 × 1010cm Hz1/2W-1, offering a scalable pathway toward low-cost, uncooled infrared imaging systems and demonstrating significant potential for practical applications.

【基金】 supported by the National Natural Science Foundation of China (62134001, 92464303, 12574128, U23A20364, 62104171, and 623B2078);the Wuhan Industrial Innovation Joint Laboratory (2024050902040443);the Strategic Priority Research Program of Inner Mongolia University of Technology (BS2024074);Nei Mongol Autonomous Region Science and Technology Program (2025YFHH0119)
  • 【文献出处】 Science Bulletin ,科学通报(英文版) , 编辑部邮箱 ,2026年07期
  • 【分类号】TP212;TB383.2
  • 【下载频次】3
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