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基于近场光学的近原子尺度精密测量与制造(英文)
Close-to-atom scale precision measurement and manufacturing via near-field optics
【摘要】 <正>The pursuit of high speed, large capacity, and low power consumption of electronic and photonic systems drives the long-term tendency of device miniaturization. The gate width in typical transistors has been reduced to several nanometers in 7 to 2 nm photolithographic processes, while nano-electronic devices from twodimensional(2D) materials possess even smaller critical dimensions. For example, Desai et al. [1] reported a gate length of 1 nm that overcame the critical barriers of quantum tunneling and electrostatic control in ultra-scaled silicon transistors. Furthermore,on-chip quantum devices require manipulation of excitons [2],phonons [3], surface plasmons [4], and spins [5] at the single-atom level. Gao et al.
【关键词】 原子尺度;
近场光学;
精密测量;
pursuit;
photonic;
scaled;
electrostatic;
dimensions;
length;
tunneling;
【基金】 supported by the National Key R&D Program of China (2024YFB4505100)
- 【文献出处】 Science Bulletin ,科学通报(英文版) , 编辑部邮箱 ,2026年01期
- 【分类号】O439
- 【下载频次】2