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基于近场光学的近原子尺度精密测量与制造(英文)

Close-to-atom scale precision measurement and manufacturing via near-field optics

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【作者】 冯芃轶白本锋孙洪波

【Author】 Peng-Yi Feng;Benfeng Bai;Hong-Bo Sun;State Key Laboratory of Precision Measurement Technology and Instruments,Department of Precision Instrument,Tsinghua University;

【通讯作者】 白本锋;孙洪波;

【机构】 State Key Laboratory of Precision Measurement Technology and Instruments,Department of Precision Instrument,Tsinghua University

【摘要】 <正>The pursuit of high speed, large capacity, and low power consumption of electronic and photonic systems drives the long-term tendency of device miniaturization. The gate width in typical transistors has been reduced to several nanometers in 7 to 2 nm photolithographic processes, while nano-electronic devices from twodimensional(2D) materials possess even smaller critical dimensions. For example, Desai et al. [1] reported a gate length of 1 nm that overcame the critical barriers of quantum tunneling and electrostatic control in ultra-scaled silicon transistors. Furthermore,on-chip quantum devices require manipulation of excitons [2],phonons [3], surface plasmons [4], and spins [5] at the single-atom level. Gao et al.

【基金】 supported by the National Key R&D Program of China (2024YFB4505100)
  • 【文献出处】 Science Bulletin ,科学通报(英文版) , 编辑部邮箱 ,2026年01期
  • 【分类号】O439
  • 【下载频次】2
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