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Regulation mechanism of Si vacancies in unintentional silicon-doped diamond by gas flow in MPCVD

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【作者】 杨凯顾梁雪赵耕右汤琨冯博叶建东张荣朱顺明顾书林

【Author】 Kai Yang;Liangxue Gu;Gengyou Zhao;Kun Tang;Bo Feng;Jiandong Ye;Rong Zhang;Shunming Zhu;Shulin Gu;School of Electronic Science and Engineering, Nanjing University;

【通讯作者】 汤琨;顾书林;

【机构】 School of Electronic Science and Engineering, Nanjing University

【摘要】 Diamond with silicon vacancies has an important role as a promising single-photon source applicable in the quantum information field. However, in a microwave plasma chemical vapor deposition(MPCVD) system, due to the presence of unintentional silicon doping sources such as quartz windows, the behavior of silicon vacancy formation in silicon-doped diamond is complex. In this work, the underlying mechanism of formation of silicon vacancies by unintentional silicon doping in diamond is investigated from the perspective of growing surface kinetics in a two-gas-flow MPCVD system. This system is equipped with a novel susceptor geometry designed to deliver an additional gas flow directly onto the substrate surface. Increasing the concentration of growth doping substances on the substrate surface thereby enhances the efficiency of silicon vacancy formation in diamond. At the same time, by changing the substrate deposition angle the distribution of gas and plasma on the substrate surface is changed, thereby regulating the concentration and distribution of silicon vacancies formed by unintentional silicon doping. Experimental and computational results demonstrate that the difference in silicon vacancies formed by unintentional silicon doping in diamond depends on the substances present on the substrate surface and the distribution of plasma.

【Abstract】 Diamond with silicon vacancies has an important role as a promising single-photon source applicable in the quantum information field. However, in a microwave plasma chemical vapor deposition(MPCVD) system, due to the presence of unintentional silicon doping sources such as quartz windows, the behavior of silicon vacancy formation in silicon-doped diamond is complex. In this work, the underlying mechanism of formation of silicon vacancies by unintentional silicon doping in diamond is investigated from the perspective of growing surface kinetics in a two-gas-flow MPCVD system. This system is equipped with a novel susceptor geometry designed to deliver an additional gas flow directly onto the substrate surface. Increasing the concentration of growth doping substances on the substrate surface thereby enhances the efficiency of silicon vacancy formation in diamond. At the same time, by changing the substrate deposition angle the distribution of gas and plasma on the substrate surface is changed, thereby regulating the concentration and distribution of silicon vacancies formed by unintentional silicon doping. Experimental and computational results demonstrate that the difference in silicon vacancies formed by unintentional silicon doping in diamond depends on the substances present on the substrate surface and the distribution of plasma.

【基金】 supported by the National Natural Science Foundation of China (Grant No.62274084);the Fundamental Research Funds for the Central Universities (Grant No.0210-14380193)
  • 【文献出处】 Chinese Physics B ,中国物理B , 编辑部邮箱 ,2025年11期
  • 【分类号】O53
  • 【下载频次】4
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