【摘要】 亮环境下太阳光容易淹没光伏电池板光致发光（photoluminescence, PL）现象的缺陷信息，使检测设备无法直接感知缺陷。针对此问题，提出了一种基于时域误差的检测方法，能够有效降低亮环境下太阳光的干扰。该方法利用快速PWM(pulse width modulation)斩波恒流电源输出高频调制电流信号，驱动850 nm光源输出调制光激励光伏电池板，使用短波红外线阵InGaAs相机捕捉具有调制特性的图像序列，经现场可编程门阵列（field programmable gate array, FPGA）从图像序列中提取光伏电池板的缺陷信息。实验结果表明，该方法能够在2.9 lx～(12 580±5) lx的照度范围内有效地检测缺陷图案信息，实现亮环境下光伏电池板的连续性缺陷检测。更多还原

【Abstract】 In bright environments, sunlight can easily drown out the defect information of photoluminescence(PL) phenomenon of photovoltaic panels, so that the inspection equipment cannot directly perceive the defects.To solve this problem, a detection method based on time domain error was proposed, which could effectively reduce the interference of sunlight in bright environments. In this method, the fast pulse width modulation(PWM) chopping constant current power supply was used to output the high-frequency modulated current signal, the 850 nm light source was driven to output the modulated light to excite the photovoltaic panel, the short-wave linear infrared array InGaAs camera was used to capture the image sequence with modulation characteristics, and the defect information of the photovoltaic panel was extracted from the image sequence by field programmable gate array(FPGA). Experimental results show that the proposed method can effectively detect defect pattern information in the illumination range from 2.9 lx to(12 580±5) lx, and realize the continuous defect detection of photovoltaic panels in bright environments.更多还原