节点文献
一种JESD204B总线型D/A转换器单粒子功能中断评估方法研究
SEFI Characterization of High Speed JESD204B Interface Digital-to-analog Converter
【摘要】 超高速数/模转换器(DAC)是微波回程系统和雷达干扰机信号处理单元的核心单元,在宇航环境中易受射线辐照影响导致功能异常,由于其接口数据速率极高,评估其单粒子功能中断具有很大的挑战。本文研究并分析高速DAC在重离子环境存在的四种单粒子功能中断类型,提出一种针对JESD204B接口DAC(≥12 GS/s)的单粒子功能中断地面模拟测试方法,结合电流舵数/模转换器结构设计实现JESD204B接口数/模转换器的单粒子功能中断在线测试系统。在中国原子能院串列加速器(HI-13)与空间环境地面模拟装置(SESRI)上进行试验验证,成功监测与器件结构机理分析一致的单粒子功能中断现象,对后续加固设计具有一定的指导意义。
【Abstract】 High-speed digital-to-analog converters(DACs) are core components of microwave return systems and radar jammer signal processing units. In the aerospace environment, they are highly susceptible to radiation, which can lead to functional abnormalities. Due to their extremely high interface data rate, evaluating single-event functional interrupts(SEFI) presents significant challenges. This study investigates and analyzes four types of single-event functional interruptions in high-speed DACs in heavy ion environments. A single-event functional interrupt ground simulation testing method for JESD204B interface DACs ( ≥12 GS/s) is proposed. Additionally, a single-event functional interrupt online testing system for JESD204B interface digital/analog converters, based on the current steering structure, is designed and implemented. Experimental verification was conducted at the HI-13 and SESRI facilities, successfully monitoring the single-event functional interrupt phenomena, which were consistent with the device structure mechanism analysis. This work provides valuable guidance for subsequent reinforcement design.
- 【文献出处】 微电子学 ,Microelectronics , 编辑部邮箱 ,2025年01期
- 【分类号】TN792
- 【下载频次】7