【摘要】 近年来，透射电子显微技术取得了突飞猛进的发展，扫描透射技术（STEM）尤为瞩目。作为一种能够在原子尺度上实现材料微结构与精细化学组分表征分析的先进手段，STEM为从微观尺度理解材料宏观性能提供了关键依据。本文系统介绍并对比了透射电镜中几种典型的扫描透射成像技术，包括环形明场像（ABF）、环形暗场像（ADF）、积分差分相位衬度像（iDPC）及4D-STEM技术，深入解析其成像原理、技术特点及科学研究中的代表性应用案例，旨在帮助科研工作者更全面地理解STEM成像技术体系，并为其在各自学术与科研领域的应用提供参考。更多还原

【Abstract】 In recent years, transmission electron microscopy(TEM) has undergone remarkable advancements, with scanning transmission electron microscopy(STEM) emerging as a leading technique. As an advanced approach for characterizing and analyzing the microstructures and fine chemical compositions of materials at the atomic scale, STEM provides critical insights for understanding the macroscopic properties of materials at the microscale. This article systematically introduces and compares several typical scanning transmission imaging techniques of TEM, including annular bright-field(ABF), annular dark-field(ADF), integrated differential phase contrast(iDPC), and 4D-STEM. It deeply explores their imaging principles, technical features, and representative application cases in scientific research, aiming to help researchers develop a more comprehensive understanding of the STEM imaging technology system and provide references for their applications in various academic and research fields.更多还原