【摘要】 精确测量材料的二次电子发射系数（SEY）对研究航天器表面材料充放电具有重要意义。在二次电子测量装置中，栅网电子透过率是影响材料SEY测量精度的重要参数。文章通过仿真计算对一种多层球形SEY测量装置中影响栅网电子透过率的因素进行研究，并对栅网网格参数进行优化。结果表明：栅网偏压对栅网电子透过率的影响较小；栅网网格参数是影响栅网电子透过率的主要因素，栅网线径为0.025 mm、格线间距为1 mm时栅网电子透过率达到最大。研究可为优化SEY测量装置设计提供参考。更多还原

【Abstract】 To accurately measure the secondary electron yield(SEY) is of great significance for studying the charge and discharge of spacecraft surface materials. The electron transmittance through grid in the secondary electron measurement device is an important factor affecting the measurement accuracy of the SEY of materials.In this paper, the causes of influencing the electron transmittance through grid in a multi-layer spherical SEY measurement device was simulated by calculation, and the geometry parameters of grid were optimized. The results show that the grid bias exhibits little effect on the electron transmittance through grid, whereas the grid geometry parameters are the main influencing factor. When the grid wire is 0.025 mm in diameter and the grid spacing is 1 mm, the electron transmittance reaches the maximum. The proposed research may provide a reference for optimizing the design of SEY measurement device.更多还原