【摘要】 分析SF₆放电分解产物组分和含量的动态变化是SF₆封闭式组合电器（Gas-Insulated Switchgear, GIS）状态诊断的关键。本文提出荧光抑制光纤增强拉曼光谱（Fiber-Enhanced Raman Spectroscopy, FERS）动态高灵敏检测方法。首先搭建了SF₆放电分解产物荧光抑制FERS检测系统，通过结合CCD数字滤波和小孔空间滤波的协同荧光滤波方法，系统信噪比提升228.4%；基于Allan方差分析确定了系统最佳积分时间为220 s。然后在2 bar压强、220 s积分时间下，基于标准混合气体样品分析确定了用于同时定性与定量分析SF₆放电分解产物SOF₂,SO₂F₂,COS,CF₄,SO₂,CO₂,CO的特征拉曼谱峰，并计算得检测下限分别为1.95 ppm,1.78 ppm,0.83 ppm,2.41 ppm,0.93 ppm,2.51 ppm,6.69 ppm。最后通过连续168 h的GIS等比缩小模型局部放电实验证明了上述系统可实现SF₆放电分解产物的动态高灵敏检测，且与气相色谱法结果偏差小于±5%。实验结果表明，本文提出的检测方法可为GIS的安全运行提供技术支撑。更多还原

【Abstract】 Analyzing the dynamic change of composition and concentration of SF₆ discharge decomposition products is the key to SF₆ Gas-Insulated Switchgear（GIS） state diagnosis. This paper proposed a dynamic and high-sensitive detection method based on fluorescence-suppressed Fiber-Enhanced Raman Spectroscopy（FERS）. Firstly, a fluorescence-suppressed FERS gas detection system of SF₆ discharge decomposition products is established. With a Synergistic Fluorescence Filtering method combining CCD digital noise filtering and iris noise reduction, the signal-to-noise ratio of the system is increased by 228. 4%.Based on Allan variance analysis, the optimal integration time of the system is determined to be 220 s.Next, by analyzing standard mixed gas samples under 2 bar pressure and 220 s integration time, the characteristic Raman peaks for qualitative and quantitative analysis of SF₆ discharge decomposition products SOF₂, SO₂F₂, COS, CF₄, SO₂, CO₂ and CO are determined, and the lower limits of detection are calculated to be 1. 95, 1. 78, 0. 83, 2. 41, 0. 93, 2. 51, 6. 69 ppm, respectively. Finally, by a 168-hour continuous partial discharge experiment in a reduced scale GIS model, the fluorescence-suppressed FERS gas detection system is proved capable of dynamic and high-sensitive detection of SF₆ discharge decomposition products, and the deviation from gas chromatography result is within ±5%. Experimental results demonstrate that the proposed detection method can provide technical support for the safe operation of GIS.更多还原