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半导体晶圆键合加压精确控制方法

Method for Precise Control of Semiconductor Wafer Bonding Pressure

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【作者】 张慧周字涛鲁统伟王成君张辉李早阳张志胜

【Author】 ZHANG Hui;ZHOU Zitao;LU Tongwei;WANG Chengjun;ZHANG Hui;LI Zaoyang;ZHANG Zhisheng;Southeast University;Hubei Key Laboratory of Intelligent Robot (Wuhan Institute of Technology);The 2nd Research Institute of CETC;Xi’an Jiaotong University;

【机构】 东南大学智能机器人湖北省重点实验室(武汉工程大学)中国电子科技集团公司第二研究所西安交通大学

【摘要】 晶圆键合质量受键合压力控制精度显著影响。对于本身有一定翘曲度的晶圆,容易在键合过程中产生非预期位移,造成键合工艺偏差,甚至碎片。因此,提出了一种基于模糊PID(比例-积分-微分)和RBF(Radial Basis Function)径向基函数神经网络算法的半导体晶圆键合压力控制方法。由于加入了模糊PID和深度学习算法控制,使得键合工艺过程响应更迅速,控制更精准,且安全性更高。采用铝样片进行加压试验,结果表明RBF神经网络模糊PID控制算法能够满足压力精度为±1%的控制需求。

【Abstract】 The bonding pressure control precision have an important influence on the bonding quality of wafers.The wafer with a certain warping degree is easy to produce unexpected displacement during the bonding process,which results in the deviation,and even fragmentation.A semiconductor wafer bonding force-control method is proposed based on fuzzy PID (proportional integral-differential) and RBF (Radial Basis Function) neural network algorithms.Due to the addition of fuzzy PID and deep learning algorithm control,the bonding process response is faster and more accurate,and the safety is higher.The force-testing experiments are done by using the aluminum samples.The results show that the RBF neural network fuzzy PID control algorithm can meet the control requirements of force accuracy with±1%.

【基金】 国家重点研发计划项目(2022YFB3404300);智能机器人湖北省重点实验室基金项目(HBIR202303)
  • 【文献出处】 电子工艺技术 ,Electronics Process Technology , 编辑部邮箱 ,2024年06期
  • 【分类号】TN305;TP183
  • 【下载频次】34
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