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碳化硅功率器件高密度互连技术研究进展

Research Progress of High Density Interconnection Technology for SiC Power Devices

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【作者】 王志宽冯治华陈容燕子鹏崔伟陆科廖希异

【Author】 WANG Zhikuan;FENG Zhihua;CHEN Rong;YAN Zipeng;CUI Wei;LU Ke;LIAO Xiyi;Analog Fundries Co., Ltd.;National Key Laboratory of Integrated Circuits and Microsystems;The 24th Research Institute of China Electronics Technology Group Corp.;

【通讯作者】 廖希异;

【机构】 中科渝芯电子有限公司集成电路与微系统全国重点实验室中国电子科技集团公司第二十四研究所

【摘要】 相比于硅,SiC材料因具有宽禁带、高导热率、高击穿电压、高电子饱和漂移速率等优点而在耐高温、耐高压、耐大电流的高频大功率器件中得到了广泛应用。传统的引线键合是功率器件最常用的互连形式之一。然而,引线键合固有的寄生电感和散热问题严重限制了SiC功率器件的性能。文章首先介绍了硅功率器件的低寄生电感和高效冷却互连技术,然后对SiC功率器件互连技术的研究进行了综述。最后,总结了SiC功率器件互连技术面临的挑战。

【Abstract】 Compared with Si material, SiC material is widely used in high frequency and high power applications with high temperature resistance, high voltage resistance and high current resistance due to its superior material properties of large band gap, high thermal conductivity, high breakdown voltage and high electron saturation drift rate. Conventional wire bonding scheme has been one of the most preferred interconnection structures for power modules. However, the technique limits the performance of a SiC power module due to parasitic inductance and heat dissipation issues that are inherent in bonding wires. In this article, low parasitic inductance and high efficient cooling interconnection techniques for Si power modules are introduced first. Then, attempts on developing interconnection techniques for SiC power modules are thoroughly introduced. Finally, challenges in the interconnection of SiC power module are summarized.

【关键词】 碳化硅功率器件封装硅材料
【Key words】 SiCpower devicepackagingSi material
【基金】 集成电路与微系统全国重点实验室基金资助项目(2022-JCJQ-LB-049-9)
  • 【分类号】TN386
  • 【下载频次】13
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