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扫描探针显微镜与外接电场联用技术在本科教学中的应用探索

Exploration of Scanning Probe Microscope and External Electric Field Combined Technology in Undergraduate Teaching

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【作者】 李洋; 孙昭媛; 徐成彦; 甄良;

【Author】 Li Yang;Sun Zhaoyuan;Xu Chengyan;Zhen Liang;School of Materials Science and Engineering,Harbin Institute of Technology;Center for Analysis and Measurements,Harbin Institute of Technology;School of Materials Science and Engineering,Harbin Institute of Technology (Shenzhen);

【机构】 哈尔滨工业大学材料科学与工程学院; 哈尔滨工业大学分析测试中心; 哈尔滨工业大学(深圳)材料科学与工程学院;

【摘要】 扫描探针显微镜是表征材料形貌特征、电学、力学、热学、磁学等物理性质的重要测试仪器之一,已列入很多工科院校仪器分析方法相关课程中。扫描探针显微镜具有开放性高、可改造能力强的特点,在实践教学中不仅向学生展示扫描探针显微镜自身的功能及应用领域,而且将扫描探针显微镜与外接电场联用,实现原位表征材料在外接电场调制作用下物理性质的变化。通过实践教学,一方面激发学生对仪器改造强烈的好奇心;另一方面为学生在材料性能分析与表征方面提供一个开放性思路,为后续的科学研究提供强有力的理论和实践的支持。

【Abstract】 Scanning probe microscope is one of the important testing instruments for characterizing the physical properties of materials,such as morphology, electricity, mechanics, thermals, and magnetism. Aiming at the characteristics of high openness and strong transform ability of scanning probe microscopes, this paper not only shows students the functionality and wide application fields of scanning probe microscopes, but also focuses on the integration of scanning probe microscopes with external electric fields, in-situ characterization of physical properties of materials under applied electric field modulation is realized. Through this practical teaching, on the one hand, it stimulates students’ strong curiosity about instrument modification, and on the other hand, it provides students with an open idea in the analysis and characterization of material properties, and provides a strong theoretical and practical basis for subsequent scientific research.

  • 【文献出处】 中国现代教育装备 ,China Modern Educational Equipment , 编辑部邮箱 ,2023年13期
  • 【分类号】G642.4;TH742-4
  • 【下载频次】8
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