【摘要】 高压MnO₂钽电容器漏电流在高温和高压应用环境中的稳定性对电路的安全性和可靠性有重要影响。通过正反向偏置V-I特性测试可知，高压MnO₂钽电容器漏电流主要为氧空位缺陷和介质表面的微晶诱发的Poole-Frenkel电流和隧穿电流。在Ta₂O₅介质表面通过浸渍的方法涂覆一层绝缘树脂阻挡层，以提高界面的势垒和Poole-Frenkel电阻，屏蔽介质表面的晶化点，且抑制氧空位缺陷和晶化点在高温和高场环境应用过程中的互作用。浪涌电流/电压冲击、高低温稳定性、加速121℃-85%RH-63 h和125℃-2000 h寿命测试表明，漏电流在高温和高压环境中的稳定性明显改善，电容器的可靠性和稳定性显著提高。该研究对电子装备系统在严酷环境中的安全可靠运行具有重要的支撑作用。更多还原

【Abstract】 The stability of the leakage current of high-voltage MnO₂ tantalum capacitors has an important impact on the safety and reliability of the circuits in high-temperature and high-voltage applications. Through the positive and negative V-I characteristic test, it is found that the dominant leakage current of high-voltage MnO₂ tantalum capacitor is Poole-Frenkel current and tunneling current, which induced by the oxygen vacancy defects and microcrystals on the surface of the membranes. The insulating resin barrier layer was coated on the surface of Ta₂O₅ by impregnation to improve the barrier height of the interfaces and the Poole-Frenkel resistance, shield the crystallization point in the surface of the membranes, and suppress the interaction between oxygen vacancy defects and crystallization point in high temperature and high voltage applications. The surge current/voltage test, high and low temperature stability test, accelerated test of 121 ℃-85%RH-63 h and 125 ℃-2000 h life test show that the stability of the leakage current in high temperature and high field environment is significantly improved, and the reliability and stability of the capacitors are significantly improved. The results provide new solutions for the safe and reliable operation of electronic equipment systems in harsh environments.更多还原