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Anomalous strain effect in heteroepitaxial SrRuO3 films on(111) SrTiO3 substrates

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【作者】 王珍珍戚炜恒毕佳畅李欣岩陈雨杨芳曹彦伟谷林张庆华王焕华张坚地郭建东刘笑然

【Author】 Zhenzhen Wang;Weiheng Qi;Jiachang Bi;Xinyan Li;Yu Chen;Fang Yang;Yanwei Cao;Lin Gu;Qinghua Zhang;Huanhua Wang;Jiandi Zhang;Jiandong Guo;Xiaoran Liu;Beijing National Laboratory for Condensed Matter Physics and Institute of Physics, Chinese Academy of Sciences;School of Physical Sciences, University of Chinese Academy of Sciences;Institute of High Energy Physics, Chinese Academy of Sciences;Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences;Beijing National Center for Electron Microscopy and Laboratory of Advanced Materials, Department of Materials Science and Engineering,Tsinghua University;Songshan Lake Materials Laboratory;

【通讯作者】 郭建东;刘笑然;

【机构】 Beijing National Laboratory for Condensed Matter Physics and Institute of Physics, Chinese Academy of SciencesSchool of Physical Sciences, University of Chinese Academy of SciencesInstitute of High Energy Physics, Chinese Academy of SciencesNingbo Institute of Materials Technology and Engineering, Chinese Academy of SciencesBeijing National Center for Electron Microscopy and Laboratory of Advanced Materials, Department of Materials Science and Engineering,Tsinghua UniversitySongshan Lake Materials Laboratory

【摘要】 We report comprehensive investigations into the structure of high-quality(111)-oriented SrRuO3 films on SrTiO3 substrates to elucidate the effect of(111) heteroepitaxial strain. We found that SrRuO3 film with a thickness of ~ 40 nm is compressively strained in plane on the substrate with full coherency. Nevertheless, the out-of-plane spacing is almost the same as in the bulk, which is at odds with the conventional paradigm. By probing a series of half-order Bragg reflections using synchrotron-based x-ray diffraction combined with analyses of the scanning transmission electron microscopy images,we discovered that the heteroepitaxial strain is accommodated via significant suppression of the degree of c+octahedral tilting and the formation of three equivalent domain structures on the(111) SrTiO3 substrate. This anomalous effect sheds light on the understanding of an unconventional paradigm of film–substrate coupling for the(111) heteroepitaxial strain.

【Abstract】 We report comprehensive investigations into the structure of high-quality(111)-oriented SrRuO3 films on SrTiO3 substrates to elucidate the effect of(111) heteroepitaxial strain. We found that SrRuO3 film with a thickness of ~ 40 nm is compressively strained in plane on the substrate with full coherency. Nevertheless, the out-of-plane spacing is almost the same as in the bulk, which is at odds with the conventional paradigm. By probing a series of half-order Bragg reflections using synchrotron-based x-ray diffraction combined with analyses of the scanning transmission electron microscopy images,we discovered that the heteroepitaxial strain is accommodated via significant suppression of the degree of c+octahedral tilting and the formation of three equivalent domain structures on the(111) SrTiO3 substrate. This anomalous effect sheds light on the understanding of an unconventional paradigm of film–substrate coupling for the(111) heteroepitaxial strain.

【基金】 Project supported by the National Key Research and Development Program of China (Grant No. 2017YFA0303600);the National Natural Science Foundation of China (Grant No. 11974409);the Strategic Priority Research Program (B) of the Chinese Academy of Sciences (Grant No. XDB33000000)
  • 【文献出处】 Chinese Physics B ,中国物理B , 编辑部邮箱 ,2022年12期
  • 【分类号】TB383.2
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