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薄膜反射镜纳秒极紫外辐照损伤

Nanosecond extreme ultraviolet radiation damage on thin film mirrors

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【作者】 李文斌李淑慧潘刘洋张哲谢春黄秋实王占山

【Author】 LI Wenbin;LI Shuhui;PAN Liuyang;ZHANG Zhe;XIE Chun;HUANG Qiushi;WANG Zhanshan;Institute of Precision Optical Engineering,MOE Key Laboratory of Advanced Micro-Structured Materials,Shanghai Frontiers Science Center of Digital Optics,Shanghai Professional Technical Service Platform for Full-Spectrum and High-Performance Optical Thin Film Devices and Applications,School of Physics Science and Engineering,Tongji University;Sino-German College of Applied Sciences,Tongji University;

【通讯作者】 王占山;

【机构】 同济大学物理科学与工程学院精密光学工程技术研究所先进微结构材料教育部重点实验室上海市数字光学前沿科学研究基地上海市全光谱高性能光学薄膜器件与应用专业技术服务平台同济大学中德工程学院

【摘要】 随着超短超强自由电子激光等光源的应用,极紫外、X射线波段薄膜反射镜的抗辐照性能备受关注。本文介绍了IPOE实验室搭建的纳秒极紫外辐照损伤装置,并对极紫外-X射线自由电子激光常用的B4C薄膜反射镜、Au和Ru金属单层膜反射镜、B4C/Ru双层膜反射镜以及极紫外光刻用Mo/Si多层膜反射镜开展了辐照损伤测试,获得了不同材料和结构的薄膜反射镜抗损伤性能,结合理论模拟揭示了热熔融、热应力和膜层间扩散反应等损伤机制的作用。

【Abstract】 Owing to an increased application of novel light sources such as ultra-short and ultra-intense free electron lasers(FEL),damage resistance of extreme ultraviolet(EUV)and X-ray thin-film mirrors has attracted wide attention. This paper introduces a nanosecond EUV damage instrument manufactured by the Institute of Precision Optical Engineering(IPOE). EUV damage tests were conducted on boron carbide(B4C)reflective mirrors,gold(Au)and ruthenium(Ru)metal monolayer mirrors,B4C/Ru bilayer mirrors commonly used in EUV and X-ray free electron lasers,and molybdenum-silicon(Mo/Si)multilayer mirrors used in EUV lithography. Damage resistances for thin-film mirrors with different optical materials and structures were determined. Combined with theoretical simulations,damage mechanisms such as thermal melting,thermal stress,and interlayer diffusion-reaction were detected.

【基金】 国家自然科学基金资助项目(No.11875203,No.61621001)
  • 【文献出处】 光学精密工程 ,Optics and Precision Engineering , 编辑部邮箱 ,2022年21期
  • 【分类号】TB383.2;TN249
  • 【下载频次】31
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