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镍基单晶高温合金中小角晶界失效机制的原位研究

In-situ study on failure mechanism of Ni-base single crystal superalloy with low angle grain boundary

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【作者】 王文帅李雪峤龙海波毛圣成张泽韩晓东

【Author】 WANG Wen-shuai;LI Xue-qiao;LONG Hai-bo;MAO Sheng-cheng;ZHANG Ze;HAN Xiao-dong;Faculty of Materials and Manufacturing, Beijing University of Technology;School of Materials Science and Engineering, Zhejiang University;

【通讯作者】 龙海波;

【机构】 北京工业大学材料与制造学部浙江大学材料科学与工程学院

【摘要】 现阶段制备出的镍基单晶高温合金中常常难以避免平行于加载方向的小角晶界存在,开展小角晶界失效机制的研究对于综合评价镍基单晶合金的服役性能具有重要指导作用。本文通过双籽晶法制备出含有小角晶界的双晶高温合金,采用透射电镜中的原位技术,开展小角晶界对镍基单晶高温合金失效机制的研究。研究发现,改变籽晶的排布方式可以制备出晶界近似平行(010)和(1■0)晶面的两类双晶;当沿(010)晶面的晶界进行拉伸时,两侧晶粒分别发生了沿滑移面的解理断裂及横截面的脆性断裂;而沿(1■0)晶面的晶界进行拉伸时,两侧晶粒仅发生沿滑移面的解理断裂。上述现象主要由合金内取向因子的差异所导致。

【Abstract】 It is difficult to avoid the existence of low-angle grain boundaries parallel to the loading direction in the preparation of Ni-base single crystal superalloys at the present stage. The study of the failure mechanism of low-angle grain boundaries plays an important role in the comprehensive evaluation of the service properties of Ni-base single crystal superalloys.In this paper, bicrystals superalloy with low angle grain boundary was prepared by double seed method, and the failure mechanism of Ni-base single crystal superalloy with low angle grain boundary was studied by in-situ technology in transmission electron microscope.It is found that by changing the arrangement of seed grains, two kinds of bicrystals with grain boundaries approximately parallel to(010) and(1■0) planes can be prepared; when the grain boundaries are stretched along the(010) plane, the dissociation fracture along the slip plane and the brittle fracture along the cross section occur respectively, while when the grain boundary is stretched along the(1■0) plane, the dissociation fracture of the grains on both sides only occurs along the slip plane.The above phenomenon is mainly caused by the difference of orientation factors in the alloy.

【基金】 国家自然科学基金项资助目(Nos.91860202,52171001,52071003);国家重点研发计划(No.2021YFA1200201);北京新星计划资助(No.Z211100002121170)
  • 【文献出处】 电子显微学报 ,Journal of Chinese Electron Microscopy Society , 编辑部邮箱 ,2022年06期
  • 【分类号】TG132.3
  • 【下载频次】10
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