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一种新型无电压折回现象的超结逆导型IGBT

Novel Superjunction Reverse Conducting IGBT Without Voltage Snapback Phenomenon

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【作者】 吴毅夏云刘超陈万军

【Author】 WU Yi;XIA Yun;LIU Chao;CHEN Wanjun;State Key Laboratory of Electronic Thin Film and Integrated Device, University of Electronic Science and Technology of China;

【机构】 电子科技大学电子薄膜与集成器件国家重点实验室

【摘要】 提出了一种新型无电压折回现象的超结逆导型绝缘栅双极型晶体管(RC-IGBT),并基于Sentaurus TCAD进行了电学特性仿真。提出的超结RC-IGBT通过超结的P柱将集电极N~+区域与P~+区域隔开,消除了传统超结RC-IGBT正向导通时存在的折回现象。与传统超结RC-IGBT结构相比,在导通电流密度为100 A/cm~2时,新结构的正向导通压降减少了20.9%,反向导通压降减少了20.7%,在相同正向导通压降(1.55 V)下,新结构的关断损耗降低了19.9%。

【Abstract】 A novel superjunction reverse conducting insulated gate bipolar transistor (RC-IGBT) without snapback phenomenon is proposed,and the electrical characteristics are simulated based on Sentaurus TCAD.The proposed superjunction RC-IGBT separates the collector N~+region from the P~+region through the P-pillar which eliminates the snapback phenomenon existing in the forward conduction of the conventional superjunction RC-IGBT.Compared with the conventional superjunction RC-IGBT structure,the forward conduction voltage of the new structure is reduced by 20.9%and the reverse conduction voltage of the new structure is reduced by 20.7%when the conduction current density is 100 A/cm~2,the turn-off loss of the new structure is reduced by 19.9%under the same conduction voltage (1.55 V).

  • 【文献出处】 电子与封装 ,Electronics & Packaging , 编辑部邮箱 ,2022年09期
  • 【分类号】TN322.8
  • 【下载频次】58
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