节点文献
Analytical solution of crystal diffraction intensity
【摘要】 Plasma density and temperature can be diagnosed by x-ray line emission measurement with crystal, and bent crystals such as von Hamos and Hall structures are proposed to improve the diffraction brightness. In this study, a straightforward solution for the focusing schemes of flat and bent crystals is provided. Simulations with XOP code are performed to validate the analytical model, and good agreements are achieved. The von Hamos or multi-cone crystal can lead to several hundred times intensity enhancements for a 200 μm plasma source. This model benefits the applications of the focusing bent crystals.
【Abstract】 Plasma density and temperature can be diagnosed by x-ray line emission measurement with crystal, and bent crystals such as von Hamos and Hall structures are proposed to improve the diffraction brightness. In this study, a straightforward solution for the focusing schemes of flat and bent crystals is provided. Simulations with XOP code are performed to validate the analytical model, and good agreements are achieved. The von Hamos or multi-cone crystal can lead to several hundred times intensity enhancements for a 200 μm plasma source. This model benefits the applications of the focusing bent crystals.
【Key words】 crystal diffraction; analytic method; x-ray diffraction;
- 【文献出处】 Chinese Physics B ,中国物理B , 编辑部邮箱 ,2021年11期
- 【分类号】O722
- 【下载频次】12