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Fabrication and Performance Investigation of Karma Alloy Thin Film Strain Gauge

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【作者】 雷鹏张丛春庞雅文杨伸勇张梅菊

【Author】 LEI Peng;ZHANG Congchun;PANG Yawen;YANG Shenyong;ZHANG Meiju;National Key Laboratory of Science and Technology on Micro/Nano Fabrication,Shanghai Jiao Tong University;Department of Micro/Nano Electronics,School of Electronic Information and Electrical Engineering,Shanghai Jiao Tong University;AVIC Beijing Changcheng Aeronautical Measurement and Control Technology Research Institute;

【通讯作者】 张丛春;

【机构】 National Key Laboratory of Science and Technology on Micro/Nano Fabrication,Shanghai Jiao Tong UniversityDepartment of Micro/Nano Electronics,School of Electronic Information and Electrical Engineering,Shanghai Jiao Tong UniversityAVIC Beijing Changcheng Aeronautical Measurement and Control Technology Research Institute

【摘要】 Karma alloy thin film strain gauges were fabricated on alumina substrates by magnetron sputtering.The electrical properties of strain gauges annealed at different temperatures were then tested.The surface morphology and phase structure of the Karma alloy thin films were analyzed using X-ray diffraction and scanning electron microscopy.The effect of the annealing temperature on the performance of the Karma alloy thin film strain gauge was also investigated.As the annealing temperature increased,it was found that the resistivity of the Karma alloy thin films decreased,whereas the temperature coefficient of resistance(TCR) of the thin film strain gauges increased.A Karma alloy thin film strain gauge was annealed at 200℃,thereby obtaining a gauge factor of 1.7 and a corresponding TCR of 64.8×10-6 K-1.The prepared Karma alloy thin film strain gauge had a lower TCR than other strain gauges at room temperature.This result can provide a reference for the preparation and application of Karma alloy thin film strain gauges in specific scenarios.

【Abstract】 Karma alloy thin film strain gauges were fabricated on alumina substrates by magnetron sputtering.The electrical properties of strain gauges annealed at different temperatures were then tested.The surface morphology and phase structure of the Karma alloy thin films were analyzed using X-ray diffraction and scanning electron microscopy.The effect of the annealing temperature on the performance of the Karma alloy thin film strain gauge was also investigated.As the annealing temperature increased,it was found that the resistivity of the Karma alloy thin films decreased,whereas the temperature coefficient of resistance(TCR) of the thin film strain gauges increased.A Karma alloy thin film strain gauge was annealed at 200℃,thereby obtaining a gauge factor of 1.7 and a corresponding TCR of 64.8×10-6 K-1.The prepared Karma alloy thin film strain gauge had a lower TCR than other strain gauges at room temperature.This result can provide a reference for the preparation and application of Karma alloy thin film strain gauges in specific scenarios.

  • 【文献出处】 Journal of Shanghai Jiao Tong University(Science) ,上海交通大学学报(英文版) , 编辑部邮箱 ,2021年04期
  • 【分类号】U664.3;TH823.3
  • 【下载频次】1
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