【摘要】 作为一种高通量的表征手段,扫描式同步辐射劳厄微衍射成像技术在研究晶体材料的结构、晶体取向、应力/应变以及显微缺陷等领域具有广阔的应用前景。伴随着高亮度同步辐射装置的建设与高速二维探测器的应用,相应自动化定制化分析软件的开发也将成为推动该技术发展的重要力量。本文介绍一款基于同步辐射微衍射实验数据定制开发的综合分析软件XtalCAMP,并以增材制造镍基高温合金DZ125L为研究材料,阐明利用该软件进行材料多尺度微观结构可视化表征、微观缺陷密度分析、晶体取向追踪以及残余应力/应变分析的科学原理,旨在通过数据处理功能的介绍与推广展现扫描式同步辐射劳厄微衍射成像技术在材料微观研究领域的技术优势,为推动该技术软硬件开发及应用进程提供借鉴与参考。更多还原

【Abstract】 As a high throughput characterization technique, scanning synchrotron polychromatic X-ray Laue microdiffraction has shown its application potential in imaging the distributions of phase, crystal orientation, strain/stress, and microscopic defects in crystalline materials. As the advent of high-brilliance synchrotron X-ray sources and high-speed area detectors, comprehensive analysis and visualization tools are greatly demanded. In this article, we introduce a custom-developed software package,XtalCAMP, and take the additively manufactured Ni-based superalloy DZ125 L as the example to demonstrate how the microscopic structure features are imaged. With the aid of this software package, the intensities of the Laue diffraction peaks are rapidly analyzed and thus the morphological features such as cracks as well as the microstructural defects distributions are imaged in real time as the Laue diffraction patterns are recorded. From the indexation results of all the Laue patterns in a scan, the crystal orientation and misorientation, and thus the high-and low-angle grain boundary distributions are visualized. By refining the Laue peak positions, the inhomogeneous local elastic strain/stress tensor is quantified. From the Laue peak profile, the content of the microscopic defects,including their type and density, are mapped.更多还原