【摘要】 为解决紫外-短波红外探测器光电性能测试和评价问题,研制了一套探测器的光谱响应、时间响应和偏压响应测试装置,为紫外-短波红外探测器的光谱响应和光电特性参量测试提供测试装置和评价依据,以便评价其综合性能指标是否满足设计和使用要求。介绍了测试装置的研制和标定过程,该测试系统由宽光谱复合光源、样品室、单色仪、锁相放大器、标准探测器等构成,实现了200～2 500 nm光谱范围内光电探测器绝对/相对光谱响应度、量子效率、归一化探测率、频响特性、偏压响应度和时间响应参量的测试功能。最后分析了照明光斑波长校准和光谱辐射照度标定的重要性,并给出标定方法和结果。更多还原

【Abstract】 A spectral response test device for ultraviolet-infrared detector is developed,with which the evaluation basis of infrared detector with visible light-short infrared waveband could be achieved by spectral response test and photoelectric property test. In this paper,the design and calibration of the test device are illustrated. The device mainly consists of combined lamp,sample room,monochrometer,lock-in amplifier,and standard detector. It can be used to obtain the absolute/relative spectral response,quantum efficiency,normalized detectivity,frequency response,bias voltage response,and time response parameters of photoelectric detector in the spectral range from 200 nm to 2 500 nm. Finally,the importance of wavelength calibration and spectral irradiance calibration are analyzed,and the calibration process and results are described.更多还原