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一维硅基OPA光相位调控性能测试系统
One-Dimensional Silicon OPA Optical Phase Control Performance Test System
【摘要】 为实现光学相控阵(OPA:Optical Phased Array)的光相位调控性能的快速测试,即快速测试OPA波束扫描角度对应的配置电压,设计了一个具有自反馈功能的闭环测试系统。由上位机控制64路驱动电源为OPA提供配置电压,通过远红外相机检测OPA出射光在成像屏上的光场分布,根据主瓣位置确定的波束扫描角度,以余弦相似度为指标与预置的扫描角度进行对比,进一步调整OPA的各路配置电压,最后得到设定的波束扫描角度对应的最佳实际配置电压。实验证明,该系统可以在16 min内实现OPA指定波束扫描角度对应的64路配置电压的快速测试,所得峰值旁瓣电平为-10 d B左右,且系统具有高稳定性,强抗干扰能力和快速测试等优点。
【Abstract】 In order to achieve the rapid test of the optical phase control performance of the optical phased array( OPA: Optical Phased Array),i. e. to quickly test the configuration voltage corresponding to the OPA beam scanning angle,a closed-loop test system with self-feedback function is designed. The 64-channel drive power supply is controlled by the host computer to provide the configuration voltage for the OPA. The far-infrared camera detects the light field distribution of the OPA’s emitted light on the Imaging screen,and the beam scanning angle is determined according to the main lobe position. Then we compare the deflection angle with the preset deflection angle by cosine similarity,and further adjust the configuration voltage of each OPA until the best actual configuration voltage corresponding to the set beam scanning angle is obtained. Experiments have proved that the system can achieve a rapid test of 64 configuration voltages corresponding to the OPA specified beam scanning angle within 16 minutes,and the peak sidelobe level obtained is about-10 dB. The system has high stability,strong anti-interference ability and fast speed.
【Key words】 optical phased array(OPA); beam scanning angle; closed loop test system; beam phase control;
- 【文献出处】 吉林大学学报(信息科学版) ,Journal of Jilin University(Information Science Edition) , 编辑部邮箱 ,2021年03期
- 【分类号】TN958.98
- 【下载频次】58