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Picosecond terahertz pump–probe realized from Chinese terahertz free-electron laser

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【作者】 王超徐文梅红樱秦华赵昕念温华张超丁岚徐勇李鹏吴岱黎明

【Author】 Chao Wang;Wen Xu;Hong-Ying Mei;Hua Qin;Xin-Nian Zhao;Hua Wen;Chao Zhang;Lan Ding;Yong Xu;Peng Li;Dai Wu;Ming Li;Key Laboratory of Materials Physics, Institute of Solid State Physics, Chinese Academy of Sciences;University of Science and Technology of China;School of Physics and Astronomy and Yunnan Key Laboratory for Quantum Information, Yunnan University;Faculty of Information Engineering, Huanghuai University;Key Laboratory of Nanodevices and Applications, Suzhou Institute of Nano-tech and Nano-bionics, Chinese Academy of Sciences;Institute of Applied Electronics, Chinese Academy of Engineering Physics;

【通讯作者】 徐文;

【机构】 Key Laboratory of Materials Physics, Institute of Solid State Physics Chinese Academy of SciencesUniversity of Science and Technology of ChinaSchool of Physics and Astronomy and Yunnan Key Laboratory for Quantum Information ,Yunnan UniversityFaculty of Information Engineering ,Huanghuai UniversityKey Laboratory of Materials Physics ,Institute of Solid State Physics Chinese Academy of SciencesKey Laboratory of Nanodevices and Applications ,Suzhou Institute of Nano-tech and Nano-bionics ,Chinese Academy of SciencesInstitute of Applied Electronics ,Chinese Academy of Engineering Physics

【摘要】 Electron energy relaxation time τ is one of the key physical parameters for electronic materials. In this study, we develop a new technique to measure τ in a semiconductor via monochrome picosecond(ps) terahertz(THz) pump and probe experiment. The special THz pulse structure of Chinese THz free-electron laser(CTFEL) is utilized to realize such a technique, which can be applied to the investigation into THz dynamics of electronic and optoelectronic materials and devices. We measure the THz dynamical electronic properties of high-mobility n-Ga Sb wafer at 1.2 THz, 1.6 THz, and2.4 THz at room temperature and in free space. The obtained electron energy relaxation time for n-Ga Sb is in line with that measured via, e.g., four-wave mixing techniques. The major advantages of monochrome ps THz pump–probe in the study of electronic and optoelectronic materials are discussed in comparison with other ultrafast optoelectronic techniques.This work is relevant to the application of pulsed THz free-electron lasers and also to the development of advanced ultrafast measurement technique for the investigation of dynamical properties of electronic and optoelectronic materials.

【Abstract】 Electron energy relaxation time τ is one of the key physical parameters for electronic materials. In this study, we develop a new technique to measure τ in a semiconductor via monochrome picosecond(ps) terahertz(THz) pump and probe experiment. The special THz pulse structure of Chinese THz free-electron laser(CTFEL) is utilized to realize such a technique, which can be applied to the investigation into THz dynamics of electronic and optoelectronic materials and devices. We measure the THz dynamical electronic properties of high-mobility n-Ga Sb wafer at 1.2 THz, 1.6 THz, and2.4 THz at room temperature and in free space. The obtained electron energy relaxation time for n-Ga Sb is in line with that measured via, e.g., four-wave mixing techniques. The major advantages of monochrome ps THz pump–probe in the study of electronic and optoelectronic materials are discussed in comparison with other ultrafast optoelectronic techniques.This work is relevant to the application of pulsed THz free-electron lasers and also to the development of advanced ultrafast measurement technique for the investigation of dynamical properties of electronic and optoelectronic materials.

【基金】 Project supported by the National Natural Science Foundation of China (Grant Nos. U1930116,U1832153,and 11574319);the Fund from the Center of Science and Technology of Hefei Academy of Sciences,China (Grant No. 2016FXZY002)
  • 【文献出处】 Chinese Physics B ,中国物理B , 编辑部邮箱 ,2020年08期
  • 【分类号】TN248.6
  • 【被引频次】3
  • 【下载频次】35
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