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Sn doped ZnO thin films as high resistivity window layer for Cu(In,Ga)Se2 solar cells

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【作者】 李博研刘芳芳林列

【Author】 LI Bo-yan;LIU Fang-fang;LIN Lie;Institute of Modern Optics, College of Electronic Information and Optical Engineering, Nankai University;Key Laboratory of Photoelectronic Thin Film Devices and Technology of Tianjin Nankai University;Key Laboratory of Photoelectronic Thin Film Devices and Technology of Tianjin;

【通讯作者】 林列;

【机构】 Institute of Modern Optics, College of Electronic Information and Optical Engineering, Nankai UniversityKey Laboratory of Photoelectronic Thin Film Devices and Technology of Tianjin Nankai UniversityKey Laboratory of Photoelectronic Thin Film Devices and Technology of Tianjin

【摘要】 For high efficiency Cu(In,Ga)Se2(CIGS) solar cell, the high-resistivity layer with high optical transmittance has to be adopted between the buffer layer and the high-conductivity window layer. In this paper, we propose Sn doped ZnO(ZTO) film, instead of the traditional intrinsic ZnO(i-ZnO) film, as an alternative n-type high-resistivity window layer for CIGS solar cell. In this experiment, both ZTO and i-ZnO films are strong(002) oriented, and the surface morphologies of the two films are almost the same. The statistical roughnesses of i-ZnO film and ZTO film are 0.58 nm and 0.63 nm, respectively. However, the optical transmittance of ZTO film is higher than that of i-ZnO film with the same thickness. The efficiency of ZTO based CIGS cell was 14.24%, which is almost the same as the efficiency of i-ZnO based CIGS cell. These results fully suggest that it is very feasible to replace i-ZnO with ZTO as the high resistant window layer.

【Abstract】 For high efficiency Cu(In,Ga)Se2(CIGS) solar cell, the high-resistivity layer with high optical transmittance has to be adopted between the buffer layer and the high-conductivity window layer. In this paper, we propose Sn doped ZnO(ZTO) film, instead of the traditional intrinsic ZnO(i-ZnO) film, as an alternative n-type high-resistivity window layer for CIGS solar cell. In this experiment, both ZTO and i-ZnO films are strong(002) oriented, and the surface morphologies of the two films are almost the same. The statistical roughnesses of i-ZnO film and ZTO film are 0.58 nm and 0.63 nm, respectively. However, the optical transmittance of ZTO film is higher than that of i-ZnO film with the same thickness. The efficiency of ZTO based CIGS cell was 14.24%, which is almost the same as the efficiency of i-ZnO based CIGS cell. These results fully suggest that it is very feasible to replace i-ZnO with ZTO as the high resistant window layer.

  • 【文献出处】 Optoelectronics Letters ,光电子快报(英文版) , 编辑部邮箱 ,2020年06期
  • 【分类号】TM914.4;TB383.2
  • 【下载频次】22
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