【摘要】 为测量晶体硅太阳电池在不同光照强度和偏压下的阻抗特性和伏安特性,设计并制作了一种太阳电池阻抗测量系统。系统以STM32F103处理器为核心,通过I2C接入阻抗数字变换芯片AD5933,用于阻抗测量,在液晶显示屏显示结果。系统设有量程切换单元,可选择合适的量程以减小测量误差。测量系统可完成太阳电池的常规I-V特性曲线和阻抗谱的测量。分析了偏置电压对太阳电池性能的影响。实测结果表明,系统可完成激励频率为100Hz～1MHz时的扫频阻抗谱测量,阻值范围为0～10MΩ,能够满足一般实验室条件下太阳电池阻抗频谱测试的要求。更多还原

【Abstract】 To measure the impedance and volt-ampere characteristics of crystalline silicon solar cells under different light intensities and bias voltages,a solar cell impedance measurement system was designed and manufactured.The system adopts STM32F103C8T6 processor as the control core,and high precision impedance digital conversion chip AD5933 as measuring core,to displays the results through the LCD screen.A range switching unit is used which can choose an appropriate range to reduce the measurement error.The system completes the I-Vcharacteristic curve measurement and achieves the impedance spectrum measurement of solar cells.The influence of bias voltage on the performance of solar cells is analyzed.Results show that the impedance range is 0～10 MΩwhen the excitation frequencies are 100 Hz～1 MHz.The system can meet the requirements of laboratory impedance measurement of solar cells.更多还原