【摘要】 本文利用X射线谱研究了吡嗪（C₄H₄N₂）分子共价吸附于硅（100）面的几种吸附构型的几何结构和电子结构.利用密度泛函理论结合团簇模型,对预测的吸附结构的碳K壳层（1s）X射线光电子能谱（XPS）和近边X射线吸收精细结构（NEXAFS）谱进行了模拟.计算结果阐明了XPS和NEXAFS谱与不同吸附构型的对应关系.与XPS谱相比,NEXAFS谱对所研究的吡嗪/硅（100）体系的结构有明显的依赖性,可以很好地用于结构鉴定.根据碳原子的分类,研究了在NEXAFS光谱中不同化学环境下碳原子的光谱成分.更多还原

【Abstract】 The geometric and electronic structures of several possible adsorption configurations of the pyrazine（C₄H₄N₂） molecule covalently attached to Si（100） surface, which is of vital importance in fabricating functional nano-devices, have been investigated using X-ray spectroscopies. The Carbon K-shell（1s） X-ray photoelectron spectroscopy（XPS） and near-edge X-ray absorption fine structure（NEXAFS） spectroscopy of predicted adsorbed structures have been simulated by density functional theory with cluster model calculations. Both XPS and NEXAFS spectra demonstrate the structural dependence on different adsorption configurations. In contrast to the XPS spectra, it is found that the NEXAFS spectra exhibiting conspicuous dependence on the structures of all the studied pyrazine/Si（100） systems can be well utilized for structural identification. In addition, according to the classification of carbon atoms, the spectral components of carbon atoms in different chemical environments have been investigated in the NEXAFS spectra as well.更多还原