Lamb waves topological imaging combining with Green’s function retrieval theory to detect near filed defects in isotropic plates

【摘要】 A method of combining Green’s function retrieval theory and ultrasonic array imaging using Lamb waves is presented to solve near filed defects in thin aluminum plates.The defects are close to the ultrasonic phased array and satisfy the near field calculation formula.Near field acoustic information of defects is obscured by the nonlinear effects of initial wave signal in a directly acquired response using the full matrix capture mode.A reconstructed full matrix of inter-element responses is produced from cross-correlation of directly received ultrasonic signals between sensor pairs.This new matrix eliminates the nonlinear interference and restores the near-field defect information.The topological imaging method that was developed in recent ultrasonic inspection is used for displaying the scatterers.The experiments are conducted on both thin aluminum plates containing two and four defects, respectively.The results show that these defects are clearly identified when using a reconstructed full matrix.The spatial resolution is equal to about one wavelength of the selectively excited mode and the identifiable defect is about one fifth of the wavelength.However, in a conventional directly captured image,the images of defects overlap together and cannot be distinguished.The proposed method reduces the background noise and allows for effective topological imaging of near field defects.更多还原

【Abstract】 A method of combining Green’s function retrieval theory and ultrasonic array imaging using Lamb waves is presented to solve near filed defects in thin aluminum plates.The defects are close to the ultrasonic phased array and satisfy the near field calculation formula.Near field acoustic information of defects is obscured by the nonlinear effects of initial wave signal in a directly acquired response using the full matrix capture mode.A reconstructed full matrix of inter-element responses is produced from cross-correlation of directly received ultrasonic signals between sensor pairs.This new matrix eliminates the nonlinear interference and restores the near-field defect information.The topological imaging method that was developed in recent ultrasonic inspection is used for displaying the scatterers.The experiments are conducted on both thin aluminum plates containing two and four defects, respectively.The results show that these defects are clearly identified when using a reconstructed full matrix.The spatial resolution is equal to about one wavelength of the selectively excited mode and the identifiable defect is about one fifth of the wavelength.However, in a conventional directly captured image,the images of defects overlap together and cannot be distinguished.The proposed method reduces the background noise and allows for effective topological imaging of near field defects.更多还原