节点文献

工作距离和探头选择对FESEM图像质量影响探析

Effects of Working Distance and Probe Selection on FESEM Image Quality

  • 推荐 CAJ下载
  • PDF下载
  • 不支持迅雷等下载工具,请取消加速工具后下载。

【作者】 徐泽忠林中清

【Author】 XU Ze-zhong;LIN Zhong-qing;Analysis and Testing Center of Hefei University;Modern Experimental Technology Center of Anhui University;

【机构】 合肥学院分析测试中心安徽大学现代实验技术中心

【摘要】 为了探讨不同工作距离下考察探头和样品的相对位置的选择对最后测试结果的影响,以泡沫镍及介孔二氧化硅小球这两种典型样品为例,通过变换探头及电镜参数的方法,进行了对比研究。分析结果表明:工作距离越大,分辨率不一定越差。旨在为电镜测试中工作距离和探头选择提供参考依据。

【Abstract】 In order to explore the influence of the choice of relative positions of probe and sample under different working distances on the final test results, two typical samples, nickel foam and malodorous silica pellet, were taken as examples and the comparative study was conducted by changing the parameters of probe and electron microscope.The results show that the higher the working distance, the resolution is not necessarily worse.The purpose of this paper is to provide reference for the selection of working distance and probe in electron microscope test.

  • 【文献出处】 佳木斯大学学报(自然科学版) ,Journal of Jiamusi University(Natural Science Edition) , 编辑部邮箱 ,2019年04期
  • 【分类号】TG146.15;TQ127.2
  • 【下载频次】35
节点文献中: 

本文链接的文献网络图示:

本文的引文网络