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K-shell excitation dielectronic recombination resonance strengths of highly charged Helike to O-like Xe ions

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【作者】 徐天衡熊刚肖君杨洋Roger HUTTON邹亚明姚科

【Author】 Tianheng XU;Gang XIONG;Jun XIAO;Yang YANG;Roger HUTTON;Yaming ZOU;Ke YAO;Shanghai EBIT Laboratory, Institute of Modern Physics, and Key Laboratory of Nuclear Physics and Ionbeam Application (MOE), Fudan University;Research Center of Laser Fusion, China Academy of Engineering Physics;

【机构】 Shanghai EBIT Laboratory, Institute of Modern Physics, and Key Laboratory of Nuclear Physics and Ionbeam Application (MOE), Fudan UniversityResearch Center of Laser Fusion, China Academy of Engineering Physics

【摘要】 Dielectronic recombination is an important process in high temperature plasmas. In the present work, the KLn(n?=?L, M, N and O) DR resonance strengths of He-like to O-like xenon ions are measured at the Shanghai electron beam ion trap using a fast electron beam energy scanning method. The experiment uncertainty reaches about 6% with significant improvement of statistics.A relativistic configuration interaction calculation is also made. Theoretical results agree with the experiment results within 15% in most cases.

【Abstract】 Dielectronic recombination is an important process in high temperature plasmas. In the present work, the KLn(n?=?L, M, N and O) DR resonance strengths of He-like to O-like xenon ions are measured at the Shanghai electron beam ion trap using a fast electron beam energy scanning method. The experiment uncertainty reaches about 6% with significant improvement of statistics.A relativistic configuration interaction calculation is also made. Theoretical results agree with the experiment results within 15% in most cases.

【基金】 supported by the National Key Research and Development Program of China under Grant No.2017YFA0402300
  • 【文献出处】 Plasma Science and Technology ,等离子体科学和技术(英文版) , 编辑部邮箱 ,2018年07期
  • 【分类号】O53
  • 【下载频次】19
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