节点文献
K-shell excitation dielectronic recombination resonance strengths of highly charged Helike to O-like Xe ions
【摘要】 Dielectronic recombination is an important process in high temperature plasmas. In the present work, the KLn(n?=?L, M, N and O) DR resonance strengths of He-like to O-like xenon ions are measured at the Shanghai electron beam ion trap using a fast electron beam energy scanning method. The experiment uncertainty reaches about 6% with significant improvement of statistics.A relativistic configuration interaction calculation is also made. Theoretical results agree with the experiment results within 15% in most cases.
【Abstract】 Dielectronic recombination is an important process in high temperature plasmas. In the present work, the KLn(n?=?L, M, N and O) DR resonance strengths of He-like to O-like xenon ions are measured at the Shanghai electron beam ion trap using a fast electron beam energy scanning method. The experiment uncertainty reaches about 6% with significant improvement of statistics.A relativistic configuration interaction calculation is also made. Theoretical results agree with the experiment results within 15% in most cases.
【Key words】 dielectronic recombination(DR); electron ion beam trap(EBIT);
- 【文献出处】 Plasma Science and Technology ,等离子体科学和技术(英文版) , 编辑部邮箱 ,2018年07期
- 【分类号】O53
- 【下载频次】19