节点文献
DAST晶体XPS数据分析基准的讨论
Discussion of the Datum on XPS Data Analysis of DAST Crystals
【摘要】 为了方便地表征4-(4-二甲基氨基苯乙烯基)甲基吡啶对甲基苯磺酸盐(DAST)的性质,采用X射线光电子能谱仪(XPS)分别对两种原粉的DAST晶体、吸附有一定量水的DAST籽晶和新制备的DAST籽晶进行了表面元素分析。通过分析数据,并选取其中合适峰位的元素作为数据分析时的基准。结果表明,DAST晶体中的C、N、O元素均不适合作为XPS数据分析的基准元素,可能来源于表面沾污的Si元素也不能作为数据分析的基准,而将晶体中硫元素(167.50eV)作为基准,校准数据后分析C、N元素,其结果是合理的。
【Abstract】 In order to conveniently characterize the properties of DAST,two kinds of raw materials,the amethyst with a certain amount of water and newly prepared amethyst of the DAST crystals were analyzed by X-ray photoelectron spectroscopy.Select the appropriate element acted as a datum for data analysis.Results showed that C,N,O and Si coming from the surface contamination probably were not suitable for a datum.Sulfur(167.50eV)as a datum in the analysis of DAST crystals is quite reasonable through the analysis C and N after calibration.
- 【文献出处】 材料导报 ,Materials Review , 编辑部邮箱 ,2018年S2期
- 【分类号】O734
- 【下载频次】128