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宏孔硅光辅助电化学腐蚀光谱响应特性研究
Study of Spectral Response Characteristic for Photo-electrochemical Etching of Macroporous Silicon
【摘要】 设计了硅光辅助电化学腐蚀光谱响应曲线的测量实验,计算了在氢氟酸溶液中n型硅的光谱响应特性曲线,发现随着波长的增加,光谱响应度明显增加.选择卤素灯和LED(850nm)作为光源,测量了n型硅光辅助电化学腐蚀I-V曲线,结果证明,光随着波长的增加在硅中的穿透深度也增加是导致光谱响应度和波长成正比的根本原因.
【Abstract】 The spectral response characteristics of photo-electrochemical etching(PEC)of macroporous Si were researched,and the measurement experiments were designed.The spectral response curves of n-type silicon wafer was presented in aqueous HF.The halogen lamp and a center wavelength of 850 nm LED array were used as the light source,then the current-voltage curves of photo-electrochemical etching of silicon were measured in aqueous HF using back-side illumination.The experimental results were analyzed theoretically in detail.
【关键词】 宏孔硅;
光辅助电化学腐蚀;
光谱响应;
LED;
【Key words】 macroporous silicon; photo-electrochemical etching; spectral response; light-emitting diode;
【Key words】 macroporous silicon; photo-electrochemical etching; spectral response; light-emitting diode;
【基金】 国家自然科学基金(61107027,51502023);吉林省科技厅重大科技招标项目(20150203012GX);吉林省教育厅项目(20160358)
- 【文献出处】 岭南师范学院学报 ,Journal of Lingnan Normal University , 编辑部邮箱 ,2017年06期
- 【分类号】TN305.2
- 【下载频次】53