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A review for compact model of graphene field-effect transistors

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【作者】 卢年端汪令飞李泠刘明

【Author】 Nianduan Lu;Lingfei Wang;Ling Li;Ming Liu;Key Laboratory of Microelectronic Devices & Integrated Technology, Institute of Microelectronics, Chinese Academy of Sciences;University of Chinese Academy of Sciences;Jiangsu National Synergetic Innovation Center for Advanced Materials (SICAM);

【机构】 Key Laboratory of Microelectronic Devices & Integrated Technology, Institute of Microelectronics, Chinese Academy of SciencesUniversity of Chinese Academy of SciencesJiangsu National Synergetic Innovation Center for Advanced Materials (SICAM)

【摘要】 Graphene has attracted enormous interests due to its unique physical, mechanical, and electrical properties. Specially,graphene-based field-effect transistors(FETs) have evolved rapidly and are now considered as an option for conventional silicon devices. As a critical step in the design cycle of modern IC products, compact model refers to the development of models for integrated semiconductor devices for use in circuit simulations. The purpose of this review is to provide a theoretical description of current compact model of graphene field-effect transistors. Special attention is devoted to the charge sheet model, drift-diffusion model, Boltzmann equation, density of states(DOS), and surface-potential-based compact model. Finally, an outlook of this field is briefly discussed.

【Abstract】 Graphene has attracted enormous interests due to its unique physical, mechanical, and electrical properties. Specially,graphene-based field-effect transistors(FETs) have evolved rapidly and are now considered as an option for conventional silicon devices. As a critical step in the design cycle of modern IC products, compact model refers to the development of models for integrated semiconductor devices for use in circuit simulations. The purpose of this review is to provide a theoretical description of current compact model of graphene field-effect transistors. Special attention is devoted to the charge sheet model, drift-diffusion model, Boltzmann equation, density of states(DOS), and surface-potential-based compact model. Finally, an outlook of this field is briefly discussed.

【基金】 Project supported by the Opening Project of Key Laboratory of Microelectronics Devices and Integrated Technology,Institute of Microelectronics,Chinese Academy of Sciences,the National Natural Science Foundation of China(Grant No.61574166);the National Basic Research Program of China(Grant No.2013CBA01604);the National Key Research and Development Program of China(Grant No.2016YFA0201802);and the Beijing Training Project for the Leading Talents in S&T,China(Grant No.Z151100000315008)
  • 【文献出处】 Chinese Physics B ,中国物理B , 编辑部邮箱 ,2017年03期
  • 【分类号】O613.71;TN32
  • 【被引频次】2
  • 【下载频次】60
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