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基于脉冲红外热波技术的支柱瓷绝缘子无损检测方法
Nondestructive Testing Method of Post Porcelain Insulator Based on Pulsed Infrared Thermal Wave Technology
【摘要】 为了防止电网支柱瓷绝缘子断裂事故的发生,该文提出了一种利用脉冲红外热波技术对支柱瓷绝缘子缺陷进行无损检测的方法。该方法利用闪光灯对被检测绝缘子施加高能光脉冲,通过处理和分析红外热像仪采集到的红外热图序列识别绝缘子的缺陷。通过对支柱瓷绝缘子表面不同尺寸的裂纹缺陷进行检测实验,运用红外热图和温差-时间对数曲线两种方式识别缺陷,缺陷识别精度达到0.4mm,表明了脉冲红外热波无损检测方法对于支柱瓷绝缘子缺陷具有良好的检测效果,检测速度快,检测结果形象直观,可实现远距离检测。最后利用温度-时间对数曲线的二阶微分峰值时间对缺陷深度进行了定量分析。通过实验验证了脉冲红外热波技术应用于支柱瓷绝缘子无损检测的可行性。
【Abstract】 In order to prevent fracture accidents of porcelain post insulators in power grid, a nondestructive testing method based on pulsed infrared thermography was presented for detecting defects of porcelain post insulator. In pulsed infrared thermography, the sample was heated instantaneously by a high energy flash pulse while an infrared camera monitors the changes of surface temperature. The defects of insulator could be identified and qualified via infrared thermal images sequence processing and analysis. Crack defects of different sizes on the surface of porcelain post insulator were detected and identified by applying infrared thermal image and logarithmic temperature-time plot, and the accuracy of defect detection was obtained about 0.4 mm. The results show that pulsed infrared thermography can be used for detecting the defects of porcelain post insulator quickly, remotely, visually and effectively. Finally the defect depth was measured according to the peak time of second-order derivative of logarithmic temperature. In conclusion, the feasibility of applying pulsed infrared thermography to detect the defects of porcelain post insulator was verified by the experiments.
【Key words】 porcelain post insulator; nondestructive testing; pulsed infrared thermography; surface crack defect; infrared thermal image; logarithmic temperature-time plot; peak second-order derivative time;
- 【文献出处】 中国电机工程学报 ,Proceedings of the CSEE , 编辑部邮箱 ,2017年24期
- 【分类号】TM216
- 【被引频次】16
- 【下载频次】430