【摘要】 以Xilinx公司的28nm系统级芯片(system-on-chip,SoC)Zynq-7000为研究对象,开展了α单粒子效应实验和低能质子单粒子效应实验,测得了系统级芯片的α单粒子效应敏感模块、单粒子效应截面及不同模块质子单粒子效应截面随能量变化的关系曲线。采用软件故障注入技术获得了系统级芯片多个功能单元的敏感单元以及故障表现类型,并且通过建立系统芯片软错误故障树,定量计算了系统芯片及其各功能单元的故障率和不可用度,确定了系统和子系统中的敏感模块。更多还原

【Abstract】 Two different single event effects experiments were performed on 28 nm Xilinx Zynq-7000 system-on-chip(SoC),including alpha particles single event effects experiment and low-energy proton single event effects experiment.The sensitive blocks of Xilinx Zynq-7000 SoC,alpha particles single event effects cross sections,and the relations between proton single event effects cross sections and proton energy for different blocks were measured.In addition,the sensitive locations of hardware blocks of Xilinx Zynq-7000 SoC and error modes were obtained by using the software fault injection method.Furthermore,the failure rate and unavailability of the system were qualitatively calculated through constructing the system fault tree,and the sensitive blocks of the sub-system and the system were identified.更多还原