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The Efficiency Droop of InGaN-Based Green LEDs with Different Superlattice Growth Temperatures on Si Substrates via Temperature-Dependent Electroluminescence

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【作者】 齐维靖徐龙权莫春兰王小兰丁杰王光绪潘拴张建立吴小明刘军林江风益

【Author】 Wei-Jing Qi;Long-Quan Xu;Chun-Lan Mo;Xiao-Lan Wang;Jie Ding;Guang-Xu Wang;Shuan Pan;Jian-Li Zhang;Xiao-Ming Wu;Jun-Lin Liu;Feng-Yi Jiang;National Institute of LED on Si Substrate,Nanchang University;

【机构】 National Institute of LED on Si Substrate,Nanchang University

【摘要】 InGaN-based green light-emitting diodes(LEDs) with different growth temperatures of superlattice grown on Si(111) substrates are investigated by temperature-dependent electroluminescence between 100 K and 350 K. It is observed that with the decrease of the growth temperature of the superlattice from 895℃ to 855℃, the forward voltage decreases, especially at low temperature. We presume that this is due to the existence of the larger average size of V-shaped pits, which is determined by secondary ion mass spectrometer measurements. Meanwhile, the sample with higher growth temperature of superlattice shows a severer efficiency droop at cryogenic temperatures(about 100 K-150 K). Electron overflow into p-GaN is considered to be the cause of such phenomena, which is relevant to the poorer hole injection into multiple quantum wells and the more reduced effective active volume in the active region.

【Abstract】 InGaN-based green light-emitting diodes(LEDs) with different growth temperatures of superlattice grown on Si(111) substrates are investigated by temperature-dependent electroluminescence between 100 K and 350 K. It is observed that with the decrease of the growth temperature of the superlattice from 895℃ to 855℃, the forward voltage decreases, especially at low temperature. We presume that this is due to the existence of the larger average size of V-shaped pits, which is determined by secondary ion mass spectrometer measurements. Meanwhile, the sample with higher growth temperature of superlattice shows a severer efficiency droop at cryogenic temperatures(about 100 K-150 K). Electron overflow into p-GaN is considered to be the cause of such phenomena, which is relevant to the poorer hole injection into multiple quantum wells and the more reduced effective active volume in the active region.

【基金】 Supported by the National Natural Science Foundation of China under Grant No 61334001;the National Key Research and Development Program of China under Grant Nos 2016YFB0400600,2016YFB0400601 and 2016YFB0400100;the National Science Foundation for Young Scientists of China under Grant No 21405076;the Fund for Less Developed Regions of the National Natural Science Foundation of China under Grant No 11364034
  • 【文献出处】 Chinese Physics Letters ,中国物理快报(英文版) , 编辑部邮箱 ,2017年07期
  • 【分类号】TN312.8
  • 【被引频次】2
  • 【下载频次】28
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