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倒装LED芯片的焊料互连可靠性评估

Reliability Evaluation for Solder Interconnect of Flip-chip LED

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【作者】 蒋富裕陈亮张文林夏卫生

【Author】 JIANG Fuyu;CHEN Liang;ZHANG Wenlin;XIA Weisheng;Guangdong Tsaint Hi-tech Co.Ltd.;Huazhong University of Science and Technology;Zhuhai Yixin Semiconductor Technology Co.Ltd.;

【机构】 广东天圣高科股份有限公司华中科技大学材料科学与工程学院珠海市一芯半导体科技有限公司

【摘要】 对比测试了两类不同焊垫的倒装LED芯片的焊料互连可靠性。结果表明,采用金锡共晶合金焊垫和金焊垫的倒装LED芯片适于金锡共晶焊,具有高的互连焊点可靠性,但共晶倒装焊设备昂贵,制造成本很高;若采用普通锡基焊料封装,则由于液-固和固-固界面的焊料反应,导致焊料与焊垫之间出现严重的界面不稳定状态,进而引起不受控的焊点剥离等一系列可靠性问题。而在倒装LED芯片的焊垫材料表层增加一层焊料阻挡层,则可以通过简单的工艺流程实现高可靠的互连封装。

【Abstract】 Solder interconnection reliability of two kinds of different pads for flip-chip LED has been investigated and compared.The flip-chip LED with Au-Sn alloy pads or Au pads is suitable for Au-Sn eutectic soldering and has highest interconnection reliability.However,the Au-Sn eutectic soldering needs expensive equipments with the high manufacturing cost.As for the package by common Sn-based solders,the interface between the solder and the pads appear serious instability because of the liquidsolid or the solid-solid interface reaction,which ultimately cause a series of reliability problems,such as the uncontrolled joint dissection.By adding a barrier layer in the electrode surface of the flip-chip LED,high reliable interconnect can be able to achieved with a simple process.

【基金】 广东省产学研计划基金项目(项目编号:2013B090600031)
  • 【文献出处】 电子工艺技术 ,Electronics Process Technology , 编辑部邮箱 ,2017年04期
  • 【分类号】TN312.8
  • 【被引频次】12
  • 【下载频次】248
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