节点文献
大规模集成电路测试程序开发技术及流程应用
Development of Test Program for Large Scale Integrated Circuits
【摘要】 集成电路测试就是对集成电路进行好坏的判断,通过测量对集成电路的输出响应和预期输出进行比较,以确定或评估集成电路功能和性能的过程。而基于ATE开发完整、稳定、可靠的测试程序,是实现对大规模集成电路自动化快速在线检测最通用、最有效的手段,因此集成电路测试程序开发技术就显得非常重要。
【Abstract】 IC testing is used to evaluate the quality of ICs by comparing the output response and the expected.Developing a complete, stable and reliable test program based on ATE is the most common and effective method to realize the automatic testing of large scale integrated circuits. Studies on IC test program development technology are therefore necessary.
【关键词】 集成电路测试程序;
ATE;
参数测试;
功能测试;
【Key words】 integrated circuit test program; ATE; parameter testing; function testing;
【Key words】 integrated circuit test program; ATE; parameter testing; function testing;
- 【文献出处】 电子与封装 ,Electronics & Packaging , 编辑部邮箱 ,2017年06期
- 【分类号】TN407
- 【被引频次】7
- 【下载频次】228