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半导体表面薄膜的有效量子限制长度和极化子研究
Effective length of quantum confinement and polaron characteristics in semiconductor surface films
【摘要】 采用提出的等效方法,确定AlxGa1-xAs衬底上GaAs表面薄膜的量子限制长度,在此基础上确定了GaAs薄膜的分数维,进一步利用分数维方法研究了AlxGa1-xAs衬底上GaAs表面薄膜中的极化子特性.
【Abstract】 Within the framework of fractional-dimensional space approach,the effective length of quantum confinement is determined by an equivalent method.Result of binding energy and effective mass of a polaron confined in a GaAs film deposited on an AlxGa1-xsubstrate for different aluminum concentration at different values of film thickness have been investigated.
【关键词】 有效量子限制长度;
分数维方法;
极化子;
GaAs薄膜;
【Key words】 effective length of quantum confinement; fractional-dimensional approach; polaron; GaAs film;
【Key words】 effective length of quantum confinement; fractional-dimensional approach; polaron; GaAs film;
【基金】 国家自然科学基金资助项目(10574011,10974017)
- 【文献出处】 北京师范大学学报(自然科学版) ,Journal of Beijing Normal University(Natural Science) , 编辑部邮箱 ,2017年04期
- 【分类号】O47
- 【下载频次】34