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全自动薄膜应力仪

Novel Device for Automatic Evaluation of Thin-Film Residual Stress

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【作者】 赵升升程毓张小波梁凯

【Author】 Zhao Shengsheng;Cheng Yu;Zhang Xiaobo;Liang Kai;Shenzhen Key Laboratory of Modern Design and Manufacturing Technology,Shenzhen Polytechnic;Shenzhen Supro Instruments Limited Company;

【机构】 深圳职业技术学院深圳现代设计与制造技术重点实验室深圳市速普仪器有限公司

【摘要】 基于基片弯曲法原理,利用光杠杆放大曲率的方法,本工作研制了一套高精度全自动薄膜应力测试仪。在前期工作的基础上,该仪器实现了样品中心自动定位,样品表面曲率半径高精度测试,以及薄膜残余应力值自动计算等功能。标准光学玻璃圆台表面曲率半径的实测结果表明,应力仪测试精度达到千分位。此外,TiN薄膜应力沿层深分布的测试结果进一步验证了设备的可靠性。

【Abstract】 A novel type of the computer-controlled device has been successfully developed to automatically measure the residual stress of the thin films with high accuracy,based on substrate curvature technique,optical lever magnification and our previous work.The self-developed program is capable of positioning the sample’ s center,measuring the film s curvature and processing the residual stress with fairly high precision.The newly-developed,residual stress tester was calibrated by measuring the curvature radius of a Thorlabs’ optical spherical lens and tested by evaluating the stress depthdistribution of the arc-ion-plated TiN coatings on substrate of 306 L stainless steel.The calibration showed the accuracy up to three decimal points and a discrepancy below 0.14%.The increases of the GPa order residual stress,top-down from the surface and bottom-up from the interface,were measured,being in good agreement of the results reported in the literature.

【基金】 国家自然科学基金项目(No.51401128);深圳市科技计划项目(No.JCYJ20140508155916426)
  • 【文献出处】 真空科学与技术学报 ,Chinese Journal of Vacuum Science and Technology , 编辑部邮箱 ,2016年01期
  • 【分类号】TH823
  • 【被引频次】4
  • 【下载频次】166
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