【摘要】 运用三重串联电感耦合等离子质谱（ICP-MS/MS）仪直接测定高纯Eu₂O₃中超痕量的Tm,As和Si。采用H₂的原位质量法和O₂质量转移法,有效克服了基体对待测元素的干扰。通过优化仪器参数得到Tm,As和Si的背景等效浓度分别为0.0005763,0.08435,8.268μg·L^-1。在选定条件下,样品加标回收率为95.74%¹03.82%,相对标准偏差（RSD）为0.22%⁴.38%。本方法简单实用,能够满足纯度99.999%以上的高纯Eu₂O₃中杂质元素的快速测定。更多还原

【Abstract】 A method was developed for direct determination of Tm,As and Si in high purity europium by ICP-MS /MS. The interferences on the analysis were efficiently removed by using H₂ and O₂ reaction cell gas in MS / MS mode. Under the optimized conditions,the background equivalent concentration of 0. 0005763,0. 08435 and 8. 268 μg·L^{- 1} was achieved for Tm,As and Si,respectively. The spike recoveries of these three elements were 98. 71% 103. 26%,and the RSDs was 0. 22% 3. 75%. The method was suitable for the direct determination of impurities in high purity europium of 99. 999% or above.更多还原