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光栅常数测定实验中谱线不等高现象的分析
Analysis of Diffraction Lines with Different Heights in the Experiment of Measuring Grating Constant
【摘要】 利用分光计进行的光栅常数测定实验,当光线垂直于光栅表面入射时,若光栅刻痕与狭缝不平行,将导致衍射谱线不等高现象.我们对这种情况下产生的衍射谱线不等高现象进行了理论分析,并推导出衍射谱线偏离零级条纹的相对距离表达式,同时讨论了此现象对测量光栅常数造成的影响.
【Abstract】 In the grating constant experiment by using spectrometer,when the light is perpendicular to the surface of the grating,if the transmission grating and slit are not parallel,there is the unequal phenomenon of higher diffraction spectra. We made a theoretical analysis under this situation. We deduced the relative distance between expression of diffraction spectrum deviates from the zero order fringe,in the meantime,we discussed the influence on the measurement of grating constant.
【基金】 江苏省自然科学基金项目(BK20140583)
- 【文献出处】 南京师大学报(自然科学版) ,Journal of Nanjing Normal University(Natural Science Edition) , 编辑部邮箱 ,2016年03期
- 【分类号】O436.1
- 【被引频次】2
- 【下载频次】130