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反应磁控溅射制备SnO2薄膜及其微观形貌与光致发光性能研究

Microstructure and Photoluminescence of SnO2 Thin Films Prepared by Reactive Magnetron Sputtering

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【作者】 姚宏燚袁志钟熊志高翟艺璇李东升

【Author】 YAO Hongyi;YUAN Zhizhong;XIONG Zhigao;ZHAI Yixuan;LI Dongsheng;School of Materials Science and Engineering,Jiangsu University;State Key Laboratory of Silicon Materials,School of Materials Science and Engineering,Zhejiang University;

【机构】 江苏大学材料科学与工程学院浙江大学材料科学与工程学院硅材料国家重点实验室

【摘要】 利用反应磁控溅射法(RMS)制备了SnO2薄膜,并研究了溅射参数对薄膜微观结构和光学性能的影响。结果表明,随着溅射气压、氧分压的增大和衬底温度的升高,薄膜沉积速率相应减小;在不同衬底温度下(室温至600℃)溅射薄膜时,较高的衬底温度可得到较大的SnO2晶粒,表面更为粗糙;此外,将原生SnO2薄膜在O2气氛下退火可以改善其结晶度,原本的柱状结构转变成致密的薄膜结构,其光学禁带宽度变宽至3.85eV;经过退火的SnO2薄膜的光致发光(PL)强度显著增强,位于约610nm的PL发光峰主要是源于SnO2纳米晶体表面悬挂键的未饱和电子态。

【Abstract】 The present paper deals with the effects of reactive DC magnetron sputtering parameters on the deposition rate of SnO2 films and their microstructural and optical properties.It was found that the increase of the sputtering pressure,O2 partial pressure and substrate temperature depress the deposition rate of SnO2 thin films.SnO2 films were deposited at different temperatures(from room temperature to 600 ℃)and those deposited at higher substrate temperature have larger crystals and rough surfaces.Moreover,the annealing process in O2 improves the crystallinity and enlarges the optical band gap of SnO2 crystals to 3.85 eV,and changes the columnar structure into condensed film with nanocrystals on top.As a result,the photoluminescence(PL)intensity of the SnO2 film is greatly enhanced,with a PL line peaked at610nm mainly induced by the unoccupied electron states of the dangling bonds on surface of SnO2 nanocrystals.

【基金】 国家重点实验室开放基金(SKL2010-10)
  • 【分类号】TN304.05
  • 【被引频次】1
  • 【下载频次】214
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