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The establishment of reliability model for LED lamps

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【作者】 郝剑荆雷王尧高群客洪亮王潇洵张艳超孙强续志军

【Author】 Hao Jian;Jing Lei;Wang Yao;Gao Qun;Ke Hongliang;Wang xiaoxun;Zhang Yanchao;Sun Qiang;Xu Zhijun;Opto-Electronics Technology Center,Changchun Institute of Optics,Fine Mechanics and Physics,Chinese Academy of Sciences;University of Chinese Academy of Science;

【机构】 Opto-Electronics Technology Center,Changchun Institute of Optics,Fine Mechanics and Physics,Chinese Academy of SciencesUniversity of Chinese Academy of Science

【摘要】 In order to verify which of the distributions and established methods of reliability model are more suitable for the analysis of the accelerated aging of LED lamp,three established methods(approximate method,analytical method and two-stage method) of reliability model are used to analyze the experimental data under the condition of the Weibull distribution and Lognormal distribution,in this paper.Ten LED lamps are selected for the accelerated aging experiment and the luminous fluxes are measured at an accelerated aging temperature.AIC information criterion is adopted in the evaluation of the models.The results show that the accuracies of the analytical method and the two-stage method are higher than that of the approximation method,with the widths of confidence intervals of unknown parameters of the reliability model being the smallest for the two-stage method.In a comparison between the two types of distributions,the accuracies are nearly identical.

【Abstract】 In order to verify which of the distributions and established methods of reliability model are more suitable for the analysis of the accelerated aging of LED lamp,three established methods(approximate method,analytical method and two-stage method) of reliability model are used to analyze the experimental data under the condition of the Weibull distribution and Lognormal distribution,in this paper.Ten LED lamps are selected for the accelerated aging experiment and the luminous fluxes are measured at an accelerated aging temperature.AIC information criterion is adopted in the evaluation of the models.The results show that the accuracies of the analytical method and the two-stage method are higher than that of the approximation method,with the widths of confidence intervals of unknown parameters of the reliability model being the smallest for the two-stage method.In a comparison between the two types of distributions,the accuracies are nearly identical.

【基金】 Project supported by the National High Technology Research and Development Program of China(Nos.2015AA03A101,2013AA03A116);the Cuican Project of Chinese Academy of Sciences(No.KZCC-EW-102);the Jilin Province Science and Technology Development Plan Item(No.20130206018GX)
  • 【文献出处】 Journal of Semiconductors ,半导体学报(英文版) , 编辑部邮箱 ,2016年07期
  • 【分类号】TM923.34
  • 【下载频次】25
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