节点文献
Measurement of Refractive Index Ranging from 1.42847 to 2.48272 at 1064 nm Using a Quasi-Common-Path Laser Feedback System
【摘要】 Wavelength 1064 nm is one of the most widely used laser wavelengths in industries and science.The high-precision measurement of the refractive index of optical materials at 1064 nm is significant for improving the optical design.We study the direct measurement of refractive index at 1064 nm of lasers,including calcium fluoride(CaF2),fused silica and zinc selenide(ZnSe),whose refractive indices cover a Jarge range from 1.42847 to 2.48272.The measurement system is built based on the quasi-common-path Nd:YAG laser feedback interferometry.The thickness can be measured simultaneously with the refractive index.The results demonstrate that the system has absolute uncertainties of 10-5 and 10-4 mm in refractive index and thickness measurement,respectively.
【Abstract】 Wavelength 1064 nm is one of the most widely used laser wavelengths in industries and science.The high-precision measurement of the refractive index of optical materials at 1064 nm is significant for improving the optical design.We study the direct measurement of refractive index at 1064 nm of lasers,including calcium fluoride(CaF2),fused silica and zinc selenide(ZnSe),whose refractive indices cover a Jarge range from 1.42847 to 2.48272.The measurement system is built based on the quasi-common-path Nd:YAG laser feedback interferometry.The thickness can be measured simultaneously with the refractive index.The results demonstrate that the system has absolute uncertainties of 10-5 and 10-4 mm in refractive index and thickness measurement,respectively.
- 【文献出处】 Chinese Physics Letters ,中国物理快报(英文版) , 编辑部邮箱 ,2015年09期
- 【分类号】TN24
- 【下载频次】50