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短波红外成像系统的杂散辐射分析与抑制研究

Analysis and Suppression of Stray Radiation of Shortwave Infrared Imaging System

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【作者】 任国栋张良兰卫华赵延潘晓东

【Author】 Ren Guodong;Zhang Liang;Lan Weihua;Zhao Yan;Pan Xiaodong;Key Laboratory of Electro-Optic Control Technology, Luoyang Institute of Electro-Optical Equipment, Aviation Industry Corporation of China;

【机构】 中国航空工业集团公司洛阳电光设备研究所光电控制技术重点实验室

【摘要】 针对短波红外镜头在成像中存在杂散辐射的问题,对该镜头进行杂散辐射分析与抑制研究。通过成像实验初步分析了镜头的杂散辐射现象,运用仿真软件Tracepro对该短波红外镜头建立分析模型,获取系统的点源透射率(PST),并针对实验现象进行光线追迹,找出可能的杂散辐射路径。通过增加遮光罩、修改结构件和添加消杂光涂层的方法来抑制杂散辐射。通过测量采取抑制措施后的系统的PST值证明了该措施有效、可靠,达到了抑制镜头杂散辐射、改善成像质量的目的。

【Abstract】 According to the problem that stray radiation exists in the process of imaging at shortwave infrared lens.The stray radiation analysis and suppresses research of lens are carried on. By imaging experiment, the stray radiation phenomena of lens is analyzed preliminarily. The analysis model of shortwave infrared lens is established using simulation software Tracepro, the point source transmittance(PST) of system is obtained, rays tracing is conducted according to the experimental phenomenon, and the possible path of stray radiation is found out. Stray radiation is restrained by increase lens hood, modify the structure and adding extinction stray light coatings. The measured PST after taking the proposed methods can prove the effectiveness and trustiness of these methods, and reach the goal of suppress stray radiation of the lens and improve image quality.

  • 【文献出处】 激光与光电子学进展 ,Laser & Optoelectronics Progress , 编辑部邮箱 ,2015年12期
  • 【分类号】TN216
  • 【被引频次】7
  • 【下载频次】229
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