【摘要】 基于电化学诱导sol-gel方法制备Te/TeO₂-SiO₂复合薄膜的紫外-近红外投射光谱实验,采用透反射光谱测量法推导出Te/TeO₂-SiO₂复合薄膜在200¹100nm波长范围内的光学常数,包括光学透过率、反射率、线性吸收系数、消光系数、线性折射率及禁带宽度。研究发现,复合薄膜具有高折射率（1.93².03）,测试波长为1064nm,低吸收和禁带宽度宽（3.07³.40eV）等光学特性,同时薄膜的光学常数对制备过程中的重要参数制备电压表现出强烈的依赖性,制备电压越大薄膜的光学透过率降低,薄膜厚度增大,线性折射率增大。更多还原

【Abstract】 Based on the electrochemical induced sol-gel method,this experiment product the UV-IR spectrum of the Te/TeO₂-SiO₂ composite films. This paper adopted the spectral reflectance and transmission measurement method deduced the optical constants of Te/TeO₂-SiO₂ composite film in 200-1 100 nm wavelength range,including optical transmittance,reflectance,linear absorption coefficient,extinction coefficient,linear refractive index and optical band gap. The study found that the composite films was of many great optical properties,such as high refractive index（ 1. 93 to 2. 03）,the test wavelength of 1 064 nm,low absorption and broad forbidden band width（ 3. 07-3. 40 e V）. Besides the optical constants of composite films shows strong dependency on the voltage. The lower the voltage,the greater the optical transmittance. At the same time the film thickness was thinner,and the linear refractive index was lower.更多还原