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Low-resistance Ohmic contact on polarization-doped AlGaN/GaN heterojunction  
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【英文篇名】 Low-resistance Ohmic contact on polarization-doped AlGaN/GaN heterojunction
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【作者】 李世彬; 余宏萍; 张婷; 陈志; 吴志明;
【英文作者】 Li Shi-Bin; Yu Hong-Ping; Zhang Ting; Chen Zhi; Wu Zhi-Ming; State Key Laboratory of Electronic Thin Films and Integrated Devices; School of Optoelectronic Information; University of Electronic Science and Technology of China (UESTC); Department of Electrical & Computer Engineering; University of Kentucky; Lexington; KY 40506; USA;
【作者单位】 State Key Laboratory of Electronic Thin Films and Integrated Devices; School of Optoelectronic Information; University of Electronic Science and Technology of China (UESTC); Department of Electrical & Computer Engineering; University of Kentucky; Lexington; KY 40506; USA;
【文献出处】 Chinese Physics B , 中国物理B, 编辑部邮箱 2014年 10期  
期刊荣誉:ASPT来源刊  CJFD收录刊
【英文关键词】 polarization; AlGaN; carrier concentration; Ohmic contact;
【摘要】 High electronic density is achieved by polarization doping without an impurity dopant in graded AlGaN films. Low specific contact resistance is studied on the polarization-doped AlGaN/GaN heterojunctions by using the transmission line method(TLM). The sheet density of polarization-doped AlGaN/GaN heterojunction is 6×1014cm-2at room temperature.The linearly graded material structure is demonstrated by X-ray diffraction. The carrier concentration and mobility are characterized by a temperature-dependent Hall ...
【英文摘要】 High electronic density is achieved by polarization doping without an impurity dopant in graded AlGaN films. Low specific contact resistance is studied on the polarization-doped AlGaN/GaN heterojunctions by using the transmission line method(TLM). The sheet density of polarization-doped AlGaN/GaN heterojunction is 6×1014cm-2at room temperature.The linearly graded material structure is demonstrated by X-ray diffraction. The carrier concentration and mobility are characterized by a temperature-dependent Hall ...
【基金】 Project supported by the National Natural Science Foundation of China(Grant Nos.61204098 and 61371046)
【更新日期】 2014-10-24
【分类号】 O482
【正文快照】 1.Introduction Group III nitrides,such as GaN,AlN,and InN,have at-tracted considerable attention due to their applications in high-power electronic and optoelectronic devices.[1–3]The wurtzite(WZ)GaN-based structure grown along the c axis is foundto have

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