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基于ADuC842的中红外激光光斑测量系统设计
A Mid-Infrared Laser Beam Profiler Based on ADuC842
【摘要】 为了测量中红外激光远场光斑,采用光电探测器阵列法研制了一套探测系统。主要包括激光功率衰减装置、中红外光导型HgCdTe探测器阵列、信号调理电路、模数转换单元、ADuC842微控制器和RS-232接口。设计了中红外光电探测器阵列和相应的信号放大电路,设计了ADuC842的外设接口和数据采集程序。测量系统在实验中得到了应用,给出了实验中典型的波形和单帧光斑。光斑测量系统的空间分辨力为1 cm,光斑数据刷新频率为8 Hz。
【Abstract】 In order to measure the far-field power density distribution of mid-infrared laser, a laser beam profiler based on a photoelectric detector array is designed. The laser beam profiler consists of optical attenuators, mid-infrared photoconductive HgCdTe detectors, signal conditioning circuits, an analog-to-digital unit, microcontroller ADuC842, and a interface RS-232. The peripheral device interfaces are described. A typical waveform and an image of the mid-infrard laser beam profile obtained by the laser beam profiler in experiment are presented. The spatial resolution of the laser beam profiler is 1 cm, and the data refresh rate is 8 Hz.
- 【文献出处】 现代应用物理 ,Modern Applied Physics , 编辑部邮箱 ,2014年02期
- 【分类号】TN215;TN249
- 【被引频次】2
- 【下载频次】72