【摘要】 采用电感耦合等离子体原子发射光谱法(ICP-AES)测定了Ta10W合金中的钨量,样品用硝酸和氢氟酸溶解,在波长207.911 nm下测定,采用高纯钽进行基体匹配绘制校准曲线以消除基体干扰,加标回收率介于96%~101%,RSD小于0.38%.该方法简便快速,结果准确,可用于生产检验和标准样品检测.更多还原

【Abstract】 The determination of tungsten in tantalum tungsten is very difficult in chemical analysis. With its convenience and rapidity,the ICP-AES analysis has become a common method in determining tungsten in tungsten alloy. This paper proposes an ICP-AES method for the determination of tungsten in tantalum tungsten alloy. The optimum analytical conditions and the working parameters of the instrument were studied. The matrix matching method was used to eliminate matrix effects,i. e.,a definite amount of tantalum was added to test solutions in preparation of calibration curve. The recoveries were from 96% to 101%,and the RSD < 0. 38%. This method has proven to be convenient,rapid and suitable for production inspection and standard sample analysis.更多还原