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窄带HPM源强电磁传导耦合分析方法研究

Research on Conducted EMI Analysis Based on Narrow-Band HPM Source of High-Power Electromagnetic Environment

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【作者】 金晖谭杰刘忠

【Author】 JIN Hui;TAN Jie;LIU Zhong;Science and Technology on High Power Microwave Laboratory,Institute of Applied Electronics,CAEP;

【机构】 中国工程物理研究院应用电子学研究所高功率微波技术重点实验室

【摘要】 针对窄带HPM系统强电磁环境传导干扰的特殊性,采用理论预测、实验测量等方法对强电磁脉冲传导耦合的影响进行研究,分析导致电子仪器设备性能下降的因素,提出一种测量感应传导干扰的方法,该方法适用于对瞬变脉冲群干扰和浪涌干扰的干扰强度进行测量。定性分析测试主要针对微波种子源装置、闸流管触发模块以及激光外触发装置等部位的控制信号线缆,明确传导干扰发生时刻、大小,研究其对仪器设备性能的影响,为强电磁环境下仪器设备防护加固提供技术支撑。

【Abstract】 In allusion to its particularity,the conducted electromagnetic interference of high-power electromagnetic environment is studied with theoretical prediction and experimental measurements. Causes of performance degradation on electronical instruments and equipments are analyzed.Measuring method in conducted EMI is proposed.It is suitable for measure of electrical fast transients burst and surge.Qualitative analysis and measure are carried out during these cables,such as HPM source,thyristor trigger module,laser external trigger set etc... The formation moment and interference intensity are confirmed,influence on performance of apparatus is also studied.Technical support is provided for protection on instruments and equipments in high-power electromagnetic environments.

  • 【文献出处】 微波学报 ,Journal of Microwaves , 编辑部邮箱 ,2014年S2期
  • 【分类号】TN972
  • 【被引频次】2
  • 【下载频次】90
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