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基于傅里叶变换条纹相位法对KTN晶体二次电光系数测量的探究
RESEARCH ON THE MEASUREMENTS OF KTN CRYSTAL QUADRATIC ELECTRO-OPTIC COEFFICIENT BASED ON FOURIER TRANSFORM METHOD FRINGE PHASE METHOD
【摘要】 基于在三维形貌测量中广泛使用的傅里叶变换轮廓法,提出了一种测量KTN晶体二次电光系数的新的方法,并设计了基于麦克尔逊干涉的实验平台,进行了多次试验,得到了KTN晶体二次电光系数张量矩阵三个独立分量中的确定值.
【Abstract】 We proposed a new method to measure Quadratic electro-optic coefficient in KTN crystal based on Fourier transform profilometry method widely used in 3D topography measurement.We designed an experiment platform based on Michelson interferometer,one of the three independent components ——h11 in KTN crystal quadratic electro-optic coefficient tensor matrix was calculated.
【关键词】 二次电光系数;
傅里叶变换;
KTN晶体;
【Key words】 Kerr electro-optic coefficient; Fourier transform profilometry; KTN ciystal;
【Key words】 Kerr electro-optic coefficient; Fourier transform profilometry; KTN ciystal;
【基金】 山东省自然基金资助项目(ZR2013AM020)
- 【文献出处】 山东师范大学学报(自然科学版) ,Journal of Shandong Normal University(Natural Science) , 编辑部邮箱 ,2014年03期
- 【分类号】O734